Title, Author | Abstract |
X. Zhu, L. Massengill, Vanderbilt University; N. Seifert, Compaq Computer Presented at the 2002 IEEE NSREC |
Abstract We analyze the impact of technology scaling and internal logic design on the soft error rate (SER) in 0.35 µm and 0.25 µm Alpha 21164 and 21264 microprocessors at the device, circuit and system levels. |
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February 03, 2010
Digital Engineering Institute
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