ESD Test Results for UTMC LVDS
| Device Type | Reports | |
| 5V Without Cold Sparing | jr05_esd.doc jr05_esd.pdf |
jr06_esd.pdf jr06_esd.doc |
| 5V with Cold Sparing | jr10_esd.pdf jr10_esd.doc |
jr11_esd.pdf jr11_esd.doc |
| 3.3V parts | wd07.pdf wd07.doc |
wd08.pdf wd08.doc |
| Note that some of these devices have a relatively low ESD rating, something that is becoming more and more common with modern devices. | ||
|
utmc_swift_rcvr.doc
Q30179FA |
Background: Two LVDS line receivers were submitted for failure
analysis along with their corresponding drivers. Testing showed the drivers
were not failed and they will be addressed in a separate report.
Part Description: The 5962R9583402QXA is a low power, high speed CMOS low voltage differential signal (LVDS) quad line receiver provided in a 16-pin ceramic flatpack. Conclusion: Failure of U62 was confirmed to be related to an ESD event. ESD testing of the IN(1-4)+ inputs on U59 revealed a relatively rugged ESD resistance. Permanent degradation of the monitored pin-to-pin characteristics was not noted until 5 kV assaults were imposed on the inputs. However, one of the inputs have manifested some degradation even after 1 kV zaps. |
| lvds_fa_mla.doc
|
Three 5V, cold sparing, LVDS receivers were damaged during safe-to-mate testing. The cause of failure was ESD. |
| utmc_lvds_prop_delays_5v.pdf | Sample data on LVDS propagation delay as a function of temperature, voltage, and loading. From UTMC. Added, 12/9/2002. |
| DUT Cards | Digital photos of LVDS card and DUTS (some here, updating). |
| Lvds0997_Sep_97.PDF | September 1997 Test of LVDS Transmitters, Revision B Die. Device Latched. |
| lvtbnl0598.pdf | May 1998 Test of LVDS Transmitters, Revision B Die, New Lot. Devices Latched. |
| LVDS_July_1998.htm | July 1998 Test of LVDS Receivers. Latchup not detected during this run. |
| LVDS_September_1999.htm | September 1999 Heavy Ion Test of LVDS Driver (National, redesign). No latchup detected. SET detected. |
| TI_LVDS_September_1999.htm | September 1999 Heavy Ion Test of LVDS Driver (TI SN65LVDS31D). No latchup detected; damage detected at high LET. Testing error: tested at 5.5V, not 3.6V. Will re-test, Dec., 1999. |
| LVDS Study | HIGH-SPEED, LOW-POWER, EXCELLENT EMC: LVDS FOR ON-BOARD
DATA HANDLING Abstract The capabilities of remote-sensing instrumentation are developing rapidly. As a consequence the data rates being handled on-board spacecraft are increasing. LVDS (Low Voltage Differential Signaling) provides a means of sending data along a twisted pair cable at high speed, with low power and with excellent EMC performance. These features make LVDS ideal for satellite on-board data-handling applications. This paper assesses the suitability of LVDS for space applications as part of a data-handling system based on IEEE 1355 comparing it against other types of line driver/receiver. It explains how LVDS can be used together with IEEE 1355 to form the basis for a powerful on-board data handling system, which is capable of handling data from current and future, high data-rate instruments. |
| SpaceWire Homepage: | ESA Page: "In short, SpaceWire is an upgrade for space applications of the high-speed serial links defined in the DS-DE part of the IEEE 1355 Standard" |
| 54AC374_SEE_BNL0199.pdf | January 1999 SEU Test of National 54AC374. One device was tested from the MGS/MOLA-II flight lot with an LET threshold of approximately 40 MeV-cm2/mg. |
| LTC1419_SEL_0499.htm | Linear Technologies LTC1419 and LTC1419A Heavy Ion Test SEL Test BNL April, 1999. No single event latchup was detected. |
| IDT Dual Port SRAM Heavy Ion Test | IDT 70V3319S133PRF Dual Port SRAM; 128-pin TQFP package (added 10/17/01) |
| Acronym | Facility | Type of Testing |
|---|---|---|
| BNL | Brookhaven National Labs | Heavy Ion |
| A&M | Texas A&M | Heavy Ion |
| LBL | Lawrence Berkeley Labs | Heavy Ion |
| UCD | University of California at Davis | Proton |
| IUCF | Indiana University Cyclotron Facility | Proton |
| Co-60 | NASA/GSFC Cobalt-60 Source | Total Ionizing Dose |
| LANL | LANL Single Event Upset testing facility For information: takala@lanl.gov |
Neutron |
| NSREC | Nuclear & Space Radiation Effects Conference | |
| RADECS | Radiation and its Effects on Components & Systems | |
Many devices were tested more
than once, either to test different lots, to test for both heavy ion and proton effects,
or because of changes in the test setup or data collection.| Part # | Function | Manufacturer | Test Date(s) | Test Engineer |
|---|---|---|---|---|
| A32200DX | FPGA | ACTEL | 5/13/97(BNL); | Rich |
| CP20420 | FPGA | Crosspoint | 1/6/94(BNL); [1(NSREC94)] | Amy |
| AT6002-JC | FPGA | Atmel | 3/28/96(UCD); 4/30/96(BNL); 6/12/96(BNL); [1(NSREC96)] | Jim |
| 3090A | FPGA | Xilinx | 4/30/96(BNL); 6/12/96(BNL); [1(NSREC96)] | Tony |
| ATT2C04-2 | FPGA | AT&T | 4/30/96(BNL); [1(NSREC96)] | --- |
| CLAy-31 | RAM-based FPGA | NSC | 9/4,22/96(BNL); 11/17/96(IUCF); 2/24/97(BNL); 5/13/97; | Jim |
| Part # | Function | Manufacturer | Test Date(s) | Test Engineer |
|---|---|---|---|---|
| AT22V10 | PAL | Atmel | 8/3/93(BNL); [1(NSREC94)] | Hak |
| 22V10 | PAL | Cypress | 12/3/92(BNL); [1(NSREC93)] | Hak |
| UT22VP10 | RADPAL | UTMC MEMO | 2/21/96(BNL); [1(NSREC96)] | Hak |
| Part # | Function | Manufacturer | Test Date(s) | Test Engineer |
|---|---|---|---|---|
| AS58C1001SF | 1 Mbit EEPROM | Hitachi | 5/13/97(BNL); | Hawk/Hak |
| HS58C1001 | 1 Mbit EEPROM | Hitachi | 11/9/94(BNL); 1/24/95(BNL); [1(NSREC95), 2(NSREC96)] | Schneider |
| 28C256ERPDB | 256 kbit EEPROM | SEEQ/SEI | 11/9/94(BNL); 1/24/95(BNL); [1(NSREC95), 2(NSREC96)] | Schneider |
| SA28C256ARP | 256 kbit EEPROM | SEEQ/SEI | 1/24/95;(BNL); [1(NSREC95), 2(NSREC96)] | --- |
| E28F016SB | Flash EEPROM | Intel | 8/16/95(BNL); [1(NSREC96)] | Jim |
| DQ28C256 | 32kx8 EEPROM | SEEQ | 11/9/90(BNL); | --- |
| 82HS641A | PROM | Signetics | 11/9/90(BNL); | --- |
| Part # | Function | Manufacturer | Test Date(s) | Test Engineer |
|---|---|---|---|---|
| IMP50E10 | EPAC | IMP | 8/16/95(BNL); [1(NSREC96)] | Amy00000 |
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Last Revised:
June 12, 2003
Digital Engineering Institute
Web Grunt: Richard Katz
