PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

National Semiconductor 54AC Drive (A Sample)

 

Misc. Devices Tested for Single Event Effects

richcontent/Misc_Content/Lvds0997_Sep_97.PDF    September 1997 Test of LVDS Transmitters, Revision B Die.  Device Latched.
richcontent/Misc_Content/lvtbnl0598.pdf    May 1998 Test of LVDS Transmitters, Revision B Die, New Lot.  Devices Latched.
richcontent/Misc_Content/LVDS_July_1998.htm    July 1998 Test of LVDS Receivers.  Latchup not detected during this run.
54AC374_SEE_BNL0199.pdf    January 1999 SEU Test of National 54AC374.  One device was tested from the MGS/MOLA-II flight lot with an LET threshold of approximately 40 MeV-cm2/mg.

 

 

Your best options are to check the Radiation Effects and Analysis homepage (GSFC) , RADATA (JPL) or REDEX (NRL) databases for information, or to check with the manufacturer.

Test facility and conference acronyms are as follows:
 
Acronym Facility Type of Testing
BNL Brookhaven National Labs Heavy Ion
A&M Texas A&M Heavy Ion
LBL Lawrence Berkeley Labs Heavy Ion
UCD University of California at Davis Proton
IUCF Indiana University Cyclotron Facility Proton
Co-60 NASA/GSFC Cobalt-60 Source Total Ionizing Dose
NSREC Nuclear & Space Radiation Effects Conference
RADECS Radiation and its Effects on Components & Systems
Many devices were tested more than once, either to test different lots, to test for both heavy ion and proton effects, or because of changes in the test setup or data collection.
FPGAs
Part # Function Manufacturer Test Date(s) Test Engineer
 
A32200DX FPGA ACTEL 5/13/97(BNL); Rich
CP20420 FPGA Crosspoint 1/6/94(BNL); [1(NSREC94)] Amy
AT6002-JC FPGA Atmel 3/28/96(UCD); 4/30/96(BNL); 6/12/96(BNL); [1(NSREC96)] Jim
3090A FPGA Xilinx 4/30/96(BNL); 6/12/96(BNL); [1(NSREC96)] Tony
ATT2C04-2 FPGA AT&T 4/30/96(BNL); [1(NSREC96)] ---
CLAy-31 RAM-based FPGA NSC 9/4,22/96(BNL); 11/17/96(IUCF); 2/24/97(BNL); 5/13/97; Jim
PALs
Part # Function Manufacturer Test Date(s) Test Engineer
AT22V10 PAL Atmel 8/3/93(BNL); [1(NSREC94)] Hak
22V10 PAL Cypress 12/3/92(BNL); [1(NSREC93)] Hak
UT22VP10 RADPAL UTMC MEMO 2/21/96(BNL); [1(NSREC96)] Hak
PROMs
Part # Function Manufacturer Test Date(s) Test Engineer
AS58C1001SF 1 Mbit EEPROM Hitachi 5/13/97(BNL); Hawk/Hak
HS58C1001 1 Mbit EEPROM Hitachi 11/9/94(BNL); 1/24/95(BNL); [1(NSREC95), 2(NSREC96)] Schneider
28C256ERPDB 256 kbit EEPROM SEEQ/SEI 11/9/94(BNL); 1/24/95(BNL); [1(NSREC95), 2(NSREC96)] Schneider
SA28C256ARP 256 kbit EEPROM SEEQ/SEI 1/24/95;(BNL); [1(NSREC95), 2(NSREC96)] ---
E28F016SB Flash EEPROM Intel 8/16/95(BNL); [1(NSREC96)] Jim
DQ28C256 32kx8 EEPROM SEEQ 11/9/90(BNL); ---
82HS641A PROM Signetics 11/9/90(BNL); ---
Gate Arrays
Part # Function Manufacturer Test Date(s) Test Engineer
QYH580 gate array Chip Express 2/24/97(BNL); 5/13/97(BNL); Rich
CX2041 gate array Chip Express 8-9/97(BNL); Rich
Substrates
Part # Function Manufacturer Test Date(s) Test Engineer
Antifuse Programmable Substrate (custom) Programmable Silicon Circuit Board (PSCB) Pico Systems 5/13/97 (BNL); Rich
Technology and Miscellaneous
Part # Function Manufacturer Test Date(s) Test Engineer
IMP50E10 EPAC IMP 8/16/95(BNL); [1(NSREC96)] Amy

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Last Revised: August 07, 2002
Digital Engineering Institute
Web Grunt: Richard Katz