| a3.pdf mkj911anneala3.pdf |
Second round of testing -
S/N A3 results to 240 krads (Si) (.pdf 28 kbytes). The device has been annealled at 100C after 240 krads (Si). (.pdf 28 kbytes) |
| mkj911matchedtid.pdf | Recent TID Data on a FPGA Technology Test Vehicle. Devices irradiated at 1 krad(Si) / Hour and 4 lots showed better than 50 krad (Si) performance. (.pdf 87 kbytes) |
| RT54SX16_P08W3_A1.pdf RT54SX16_P08W3_A3.pdf RT54SX16_P08W3_A4.pdf RT54SX16_PO8W8_B1.PDF RT54SX16_P08W8_B2.htm RT54SX16_PO8W8_B3.pdf RT54SX16_PO8W8_B5.pdf RT54SX16_PO8W14_D1.pdf RT54SX16_PO8W14_D2.pdf RT54SX16_PO8W14_D3.pdf RT54SX16_PO8W14_D4.pdf |
Radiation Data of Proto RT54SX16 Lot Splits (.pdf, 19 - 33 kbytes each). |
| MKJ_Composite.pdf | Summary of total dose experiments on RT54SX16 prototypes, 3 lot splits, for the data shown above. The worst lot split showed > 50 kRad (Si) performance with the best having > 100 krad (Si) tolerance. (.pdf 38 kbytes). |
| CKJ911Runs1And2.pdf | Experimental 0.35 um TID runs (.pdf 35 kbytes). |
| AntifuseRuptureData_BNL0298.pdf | Antifuse Heavy Ion Rupture Data (preliminary) from BNL 02/98 Test Date on Production RH1020 (90A lot split) and experimental RH54SX16, RT54SX16, and 54SX16. RT54SX16 antifuse shows rad-hard capabilities. (.pdf 8 kbytes) |
| INDCKJ911.pdf | Summary of CKJ911 (Experimental) Proton Test at Indiana University, June, 1998. (.pdf 21 kbytes) |
| INDMKJ911.pdf | Summary of RT54SX16 (Prototype) Proton Test at Indiana University, June, 1998. (.pdf 32 kbytes) |
| BNL0598_RT54SX16_ AntifuseReport.PDF |
Summary of Heavy Ion Test on the Actel RT54SX16 (prototype) Antifuse at BNL, May, 1998. Four units of the RT54SX16 (prototype) showed antifuse hardness to 4.0 Volts at Gold (LET = 82.6 MeV-cm2/mg. (.pdf 4 kbytes). |
| BNL0598_RT54SX16_SEE_Report | Summary of heavy ion SEU and SEL tests on RT54SX16 prototypes at BNL, May, 1998. (.pdf 52 kbytes). |
| SX_SEU_Summary.PDF | Summary of A54SX16 and RT54SX16 (prototypes) SEU Performance at BNL in May and July, 1998. (.pdf 18 kbytes) |
| JTAG_SX_WhitePaper.PDF | "Use of SX Series Devices and IEEE 1149.1 JTAG Circuitry." This white paper reviews basic 1149.1 principles, radiation results on SX Series devices, and finishes with mitigation techniques and design considerations. (.pdf 629 kbytes) |
| SX_SEU_Hardening_BNL1198.pdf | SX "C-Mod" Flip-Flop SEU test results. "C-Mod flip-flops were constructed in a prototype RH54SX16 - note that these flip-flops are not a part of the SX architecture. This results in an increase in the SEU LET threshold as well as a substantial decrease in the upset cross-section. (.pdf 15 kbytes) |
| RH_SX_SEU_BNL1198.pdf | RH54SX16 (Proto) SEU Data using the MKJ911.CC Pattern. (.pdf 20 kbytes). |
| RHSX Antifuse Data BNL1198.htm | Summary of Heavy Ion Test on the Actel RH54SX16 (prototype) Antifuse at BNL, November, 1998. Two different antifuse "recipies" were tested, with one recipe hard at LET=60 MeV-cm2/mg with Vcore=4.4 volts. Note that this is a 3.3 VDC device. |
| PLD Irradiation Test | PLD irradiation test underway at CERN. |
| LAN1200_RT54SX16P05TID.pdf LAN1210_1202_RT54SX16P05TID RT54SX16_P05_Qual.htm |
RT54SX16 L/C P05 Total Dose Test. S/N LAN1200. RT54SX16 L/C P05 Total Dose Test. S/N LAN1210 & S/N LAN1202. RT54SX16 L/C P05 Lot qualification summary data. LAN1200 Series. |
| LAN1300_RT54SX16P10TID.pdf | RT54SX16 L/C P10 Total Dose Test. S/N LAN1300. |
| RT54SX16_SEL_JTAG_BNL0499.htm | Three RT54SX16 devices (prototype, FIB modified) were tested for SEL and JTAG upset up to an LET of 120 MeV-cm2/mg. No SEL or JTAG upset was detected. |
| A54SX32_Antifuse_BNL0499.htm | A54SX32 prototype devices (two lot splits based on antifuse "recipe") were tested for antifuse rupture. |
| A54SX16_LAN2202_TID.pdf | A54SX16 Total Dose Run, CSM, 0.35um. D/C 9840; L/C 2ACT130181 |
| RT54SX16_Pump_TID.pdf | Charge pump experiment on RT54SX16. |
| LAN2701_2_TID.pdf LAN2703_4_TID.pdf LAN2705_6_TID.pdf LAN27xx_TID_Composite.pdf |
RT54SX32 non-production devices were tested for total dose tolerance.
D/C 9949. L/C T6JP01A/003 January 21, 2000. |
| RT54SX16_P06_Qual_Run1.htm | RT54SX16 Lot P06 Total Dose Test, Run 1. Functional failure detected in situ. (2/29/2000). |
| RT54SX32_T6JP01A_Qual_Run.htm | RT54SX32 L/C T6JP01A Lot qualification summary data. LAN2800 Series. |
| RT54SX16_P06_007_Qual_Run.htm | LAN30xx, A54SX16, Qualification run to 55 krad(Si), P06/007. 3/29/00. |
| RT54SX32_LAN3600_T6JP03_K.htm RT54SX32_T6JP03_LAN36xx_Qual_Run.htm |
LAN3600, RT54SX32, T6JP03. Kamikaze runs. 9/5/00. LAN3600, RT54SX32, T6JP03. Qual. runs. 11/1/2000. |
| RT54SX16_T6HP12D_LAN42xx.htm | LAN42xx, RT54SX16, T6HP12D, Kamikaze and Qualification Runs (TID). 12/15/2000. |
| e-mail rich for the data | LAN36xx - Prompt Dose Test Report - RT54SX32 - L/C T6JP03 (12/15/2000) |
| LAN44xx_RT54SX32_T6JP05.html | LAN44xx, RT54SX32, T6JP05. Qualification run. (1/3/2001) |
| LAN49xx_RT54SX32_JP04.html | LAN49xx, RT54SX32, JP04. Qualification run. (4/13/2001) |
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