NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

QL3025_SN3_Rad.pdf QL3025_SN3_Anneal.pdf	Initial TID Run on the Quicklogic pASIC3 QL3025 to 35 krads (Si). Run (S/N 003) showed rad-tolerant performance. (.pdf 22 kbytes) Annealling of S/N 003. Current quickly dropped. (.pdf 9 kbytes).
QL3025_SN4_TID.pdf	Total Dose Irradiation of S/N 004 to approx. 37 krads (Si). (.pdf 12 kbytes).
IndQL3025.PDF	Proton Test of Quicklogic pAsic3 QL3025 @ IUCF, June, 1998. (.pdf 19 kbytes).
pASIC1_July_1998.htm	A heavy ion test was run on the Quicklogic QL24x32B Field Programmable Gate Array (FPGA). This device is produced on a 0.65 um bulk process and uses a channelled architecture, with an amorphous silicon antifuse. Latchup was detected. (.htm)
QL3025_EPI_WONE001_TID	TID Run on the Quicklogic pASIC3 QL3025-2 ESPQ208R D/C 9913CA(experimental) TID TEST D/C 9913CA @ 18.6 krad (Si)/Day. Device showed rad-tolerant performance.
QL_LowDose_1.pdf	TID Run on the Quicklogic pASIC3 QL3025-2 ESPQ208R D/C 9913CA(experimental) TID TEST D/C 9913CA @ 1 krad (Si)/Day. Device showed rad-tolerant performance.
QL3025EPI_BNL0499.htm	Heavy Ion Test at BNL (April, 1999) of experimental pASIC3 QL3025 Epi Devices.