NASA Office of Logic Design

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

 

Altera Radiation Data

Title, Authors, Reference, Link Abstract, Summary, Conclusions


Ionizing Radiation Effects in FLEX 10K50E Programmable Logic Devices

D. M. Gingrich, N. J. Buchanan, L.Chen
Centre for Subatomic Research, University of Alberta

To be presented at the 2002 Nuclear and Space Radiation Effects Conference
Phoenix, Arizona July 15 - 19, 2002

 Abstract
We have measured the effects of total ionizing dose in Altera FLEX 10K50E embedded programmable logic devices. An average total dose of 470 Gy(SiO2 ) was observed before the power supply current increased.

 


Heavy ion irradiation of ALTERA APEX FPGAs

M. Ceschia1, S.–C. Lee2, C. Wan2, M. Bellato1,3,
M. Menichelli4, A. Papi4, J. Wyss3,4 and
A. Paccagnella1,3
1 Dipartimento di Elettronica e Informatica, Università di Padova
2 Institute of Physics, Academia Sinica, Taipei 11529, Taiwan
3 Istituto Nazionale di Fisica Nucleare – Sez. Padova
4 Istituto Nazionale di Fisica Nucleare – Sez. Perugia
5 Dipartimento di Fisica, Università di Padova

Thirteenth Biennial Single Effects Symposium
Manhattan Beach, CA, April, 2002

ceschia_sees_seesymp02.ppt

 Conclusions
  • Heavy ion testing of Apex Altera FPGA’s
  • Circuits based on four Shift Registers have been designed to test the single event effects
  • Only SEFI errors have been detected; destructive SEL was avoided by using a protection circuit
  • These SEFI’s are due to SEU in the configuration memory
  • Supply current increase: both gradual and step-like (SEL’s?) have been observed
  • Cross Section per bit has been estimated by supposing that last error corresponds to entire memory corruption

(May 7, 2002).  Could not generate a .pdf file.


Ion Beam Testing of ALTERA APEX FPGAs

M. Ceschia, A. Paccagnella, M. Bellato, A. Kaminski, J. Wyss, Università di Padova; S-C. Lee, C. Wan, Institute of Physics, Academia Sinica; M. Menichelli, A. Papi, INFN

To be presented at the 2002 Nuclear and Space Radiation Effects Conference
Phoenix, Arizona July 15 - 19, 2002

 Abstract
Altera Apex SRAM-based FPGAs with 400,000 equivalent gates have been tested under heavy ion irradiation. Single Event Functional interruption is the main radiation failure, likely due to single event upset in the configuration memory.

 

Home - NASA Office of Logic Design
Last Revised: March 13, 2003
Digital Engineering Institute
Web Grunt: Richard Katz
NACA Seal