| eo1_act3.pdf eo1_act3_with_anneal.pdf |
Total Dose Test (version 1)
for EO-1 A14100A/MEC. (.pdf 10 kbytes) Added 100C, 168 hour annealling data. (.pdf 12 kbytes). Device subjected to 35 krads (Si) - after 100C 168 anneal, Icc << 1 mA. |
| esa_act3.pdf | ESA Radiation Report on Act 3. Proton, Heavy Ion, and Total Dose Results at 5.0 and 3.3 volts. (.pdf 536 kbytes). |
| act3tidsum1.pdf | Total Dose Curve for Actel Act 3. A1460A/MEC (MPTB) and A14100A (Winbond) (.pdf 99 kbytes) |
EO-1_SN4_Summary.htm eo-1_sn4_insitu.PDF eo1_sn4_trasient.PDF EO-1sn4Room_Temp.pdf EO-1sn4100C.pdf |
Total Dose Test for
EO-1 S/N 004 Summary of Performance and Parametric Data In Situ TID Measurements (.pdf 12 kbytes) Startup Current Transient Data after 35 kRad(Si) exposure. Two pages (.pdf 128 kbytes) Room Temp Anneal Data (.pdf 4 kbytes) 100C Anneal Data (.pdf 8 kbytes) |
| A14100A_TID_IRAC_RUN1.pdf | Icc strip charts of Act 3 Total Dose Test with the A14100A/MEC-UCL055 at 6 kRads (Si) per day. Results indicate < 15 kRads (Si) performance. Five pages, page 1 is a composite chart, the next four is for each individual device. (.pdf 767 kbytes). |
| In situ Data.pdf Room Temp Anneal Data.pdf 100C Temp Data.pdf Parametric Data.htm TransitionTimeRisingLan109.PDF TransitionTimeFallingLan109.PDF IccStartupTransientLan109.PDF IV Curves Lan109.PDF Raw Report Part 1.doc Raw Report Part 2.doc |
Test data for A14100A/MEC-UCL055 at 4 kRads (Si) per day, stopped at 11 kRads (Si). Parametric test data, ICC start-up current transients, output I-V curves, and output transition time scope shots over radiation. Data shown for S/N LAN109; other devices similar. |
| A14100A_TID_UCL055_PbAl.pdf | Test data for the A14100A/MEC-UCL055 devices at ~ 3 krads (Si) day. Data taken with devices in Pb-Al box, per 1019.5 |
| LAN1xx_A14100A_UCL055_4Strings.html | LAN1xx - A14100A - L/C UCL055 - Total Dose Experiment - "4Strings". January 24, 2001 |
| LAN200_In_Situ.PDF Room_Temp_Anneal.pdf LAN200_In_Situ_Extended.PDF A1425A_LAN22x_Lid_NoLid_TID.JPG |
Test data for A1425A-UCJ014X at 6
kRads (Si) per day, initial run 23.3 kRads (Si) with reasonable ICC.( .pdf 29
kbytes) Room temperature annealling showed a decrease in ICC. ( .pdf 33 kbytes). Additional total dose exposure at 1 krad(Si)/hour. (.pdf 27 kbytes) TID Data for LAN22x/A1425A. In situ total dose test using 1019.5 Pb-Al box. S/N LAN230-233 (.pdf 48 kbytes) In situ total dose test using 1019.5 Pb-Al box. S/N LAN240-243 (.pdf 46 kbytes) |
| LAN300_In_Situ.pdf LAN300_In_Situ_Set.pdf LAN300_A1460A_RTAnneal |
Test data for A1460A-UCK062 at 6
kRads (Si) per day. Lot Date Code is 9826. ~ 12 kRads (Si). Annealling data for A1460A-UCJ014X. Lot Date Code is 9826. After ~ 12 kRads (Si). |
| A14100A_LAN500_TID.pdf A14100A_LAN500_Composite.pdf |
Test data for A14100A-UCL025 at 1
krads (Si) per hour. Lot Date Code is 9705. ~ 15 kRads (Si).(.pdf 22 kbytes) Summary of A14100A-UCL025 Lot at 1 krad(Si) per hour and 4 krad(Si)/day. (.pdf 36 kbytes) |
| A141001A_UCL061A_LAN601_TID.pdf A14100A_UCL061A_TID_LAN601_2.pdf |
Test data for A14100A-UCL061A at 1
krad (Si) / hour. ~ 18 krads (Si) performance. (.pdf 31 kbytes). Plot adding second device. (.pdf 38 kbytes) |
| A14100A_LAN701_tid.pdf A14100A_LAN700_tid.pdf A14100A_LAN710_13_tid.pdf A14100A_LAN710_13_Anneal.pdf A14100A_LAN714-716_tid.pdf |
Test data for A14100A-UCL062A at 1
krad (Si) / hour. ~ 16 krads (Si) performance. (.pdf 27 kbytes). Plot adding second device. (.pdf 37 kbytes) Test data for A14100A-UCL062A at 6 krad (Si) / day. Difference in plastic vs. ceramic package. Annealling data for A14100A-UCL062A. Difference in plastic vs. ceramic package. Test data for A14100A-UCL062A with PQFP (heat sink in-front and behind part) and CQFP (lid and no lid). |
| A1425A_BNL1198.htm | A heavy ion test was conducted at Brookhaven National Labs in November, 1998. Four A1425A devices were screened for single event latchup (SEL) and antifuse rupture. No failures were detected. |
| A14100A_UCL064_TID_Lot_Split.pdf A14100A_UCL064_TID_Lot_Split2.pdf A14100A_UCL064B_TID_Report.htm |
A14100A/UCL064 Lot Split Tests. Performance varied from
~ 12-18 krads (Si) Additional A14100A/UCL064 Lot Split Tests. Lower dose rate and in Pb/Al box. Qualification test data for A14100A/UCL064B Lot split. |
| lan90x_A1460A_TID_UCK064.pdf LAN90x_A1460A_TID_Report.html |
Test data for A1460A-UCK064A at 2.5
krad (Si) / day (.pdf 60 kbytes). Full test data for A1460A-UCK064. |
| LAN200x.html | Full TID test data for A14100A, LAN200x, UCL072. Parts tested to 20 krad(Si). |
| LAN25xx.html | Full TID test data for RT14100A, LAN250x, UCL073. Parts tested to 20 krad(Si). |
| LAN35xx.html | Full TID test data for A1460A, LAN350x, UCK069. Parts tested to 16 krad(Si). |
| LAN38xx_RT14100A_UCL082.html | Full TID test data for RT14100A, LAN38xx, UCL082. Parts tested to 20 krad(Si). (10/6/2000) |
| LAN51x.html 01T-RT14100A-UCL086.pdf |
Full TID test data for RT14100A, LAN51xx, UCL086. Parts tested to 18 krad(Si). (9/24/2001) |
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Last Revised: March 13, 2003
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