| LAN52xx_RT1280A_U1H609.html | LAN52xx, RT1280A, U1H609. Qualification run. (6/27/2001) |
| LAN4700_RT1280A_U1H611.html | LAN47xx, RT1280A, U1H611. Qualification run. (3/15/2001) |
| LAN46xx_A1280A_ U1H359H_4Strings.html |
LAN46xx A1280A L/C
U1H359H Total Dose Experiment: "4Strings"
Effects of placement of combinational functions in either C or S-Modules and bias and states of internal nodes. Developing ... |
| mapa1280an2.pdf mapa1280an3.pdf map_an_sn3.pdf mapa1280an4.pdf mapsn4anneal.pdf |
Recent A1280A/MEC TID Test
for the MAP Project, December 16, 1997. Two devices irradiated at 2 krads (Si) /
Day. (.pdf 33 kbytes). mapa1280an3.pdf adds a third device irradiated at 1 krad (Si) /Day. (.pdf 60 kbytes) map_an_sn3.pdf shows a room temp annealling curve for S/N 003. (.pdf 14 kbytes) mapa1280an4.pdf adds data for S/N 004. (.pdf 84 kbytes). mapsn4anneal.pdf shows a 100C annealling curve for S/N 004 (.pdf 8 kbytes). |
| RH1280 AeroHeavy
Ion Data.pdf RH1280_JJHeavyIon.pdf |
Heavy Ion Data for the RH1280. S-Mod, C-Mod, and bypassed S-Mod upset curves. Data sets from Aeropspace Corp. and Actel (SEE Symposium, '96) (.pdf, ~ 10 kbytes each). |
| RH1280_JJProton.pdf | Proton Data for the RH1280. Data set from Actel (SEE Symposium, '96). (.pdf 9 kbytes) |
| INDA1280.pdf | Summary of A1280A Test at Indiana University, June, 1998. Multiple lots were tested, with 19 devices in all irradiated. All showed proton upsets. Total dose data is also included. (.pdf 37 kbytes) |
| A1280A_U1H466_TID.pdf A1280A_IccTransient_U1H466 A1280A_U1H466_TID_SupportIccTran A1280A_U1H466_TID_SupportIccTran_4-6 A1280A_U1H466_Charge.pdf A1280A_U1H466_PeakCurrent.pdf A1280A_U1H466_Width.pdf A1280A_U1H466_TripVoltage.pdf |
Total Dose Test of A1280A, U1H466,
Date Code 9826. Performance was ~ 5 kRads. (.pdf 47 kbytes) ICC transient data on irradiated and new devices. (.pdf 35 kbytes). Total Dose Test of A1280A, U1H466, Date Code 9826, to 4 krads(Si) - for ICC transient test. (.pdf 23 kbytes). Total Dose Test of A1280A, U1H466, Date Code 9826, to 4-6krads(Si) - for ICC transient test. Icc Transient Study of A1280A, U1H466, Date Code 9826: Charge per Pulse. Icc Transient Study of A1280A, U1H466, Date Code 9826: Peak Current. Icc Transient Study of A1280A, U1H466, Date Code 9826: Transient Pulse Width. Icc Transient Study of A1280A, U1H466, Date Code 9826: Voltage Trip Point. |
| LAN100x_U1H486_TDose.pdf LAN100x_U1H486_Anneal.pdf RT1280A_U1H486/LAN100x.html RT1280A_LAN1001_4_TID_U1H486.pdf RT1280A_LAN1010_11_TID_U1H486.pdf RT1280A_LAN100x_Voh.pdf RT1280A_LAN100x_Vol.pdf |
Total Dose Test of RT1280A, U1H486,
LAN100x, D/C 9843. Performance ~ 7krads(Si). Annealling Data for RT1280A, U1H486, D/C 9843. Full Radiation Report and Data for RT1280A, U1H486, D/C 9843 Total Dose Test of RT1280A, U1H486, LAN1001,4 D/C 9843. Performance in Pb-Al box Total Dose Test of RT1280A, U1H486, LAN1010,11 D/C 9843. Performance in Pb-Al box. Voh-Ioh Curves for RT1280A, U1H486, LAN1001,4 D/C 9843. Vol-Iol Curves for RT1280A, U1H486, LAN1001,4 D/C 9843. |
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