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Data From "Single Event Upset Susceptibility Testing of the Xilinx Virtex II FPGA," C.C. Yui¹, G.M. Swift¹, C. Carmichael², ¹ Jet Propulsion Laboratory, California Institute of Technology, ² Xilinx Inc.

This was presented at the 2002 MAPLD International Conference, September 2002, Laurel MD.  A link to the presentation and talk will be provided when the on-line Proceedings are published.

Abstract
Heavy ion testing of the Xilinx Virtex II was conducted on the configuration, block RAM and user flip flop cells to determine their single event upset susceptibility using LETs of 1.2 to 60 MeVcm²/mg. A software program specifically designed to count errors in the FPGA is used to reveal LET _(1/e) and single-event-functional interrupt failures.

Note: This was a static test and did not examine SET's such as clock upset, which can affect the design of mitigation strategies.

Chart	Description of Chart
	Cross-section vs. effective LET curve for configuration memory bits determined through the IMPACT program – Test A
	Cross-section vs. effective LET curve for configuration memory bits determined through the FIVIT program – Test B
	Cross-section vs. effective LET curve for block RAM bits determined through the FIVIT program – Test B
	Cross-section vs. effective LET curve for power-on-reset bits determined through the FIVIT program – Test B
	Cross-section vs. effective LET curve for SelectMap bits determined through the FIVIT program – Test B
	Cross-section vs. effective LET curve for configuration memory bits determined through the FIVIT program – Test C
	Cross-section vs. effective LET curve for block RAM bits determined through the FIVIT program – Test C
	Cross-section vs. effective LET curve for power-on-reset bits determined through the FIVIT program – Test C
	Cross-section vs. effective LET curve for SelectMap bits determined through the FIVIT program – Test C
	Conclusions Similar L 1/e values for configuration and BRAM cells Two SEFIs observed – POR SEFI and SelectMap SEFI. Further testing and mitigation techniques planned.

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Last Revised: September 15, 2002
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