The experimental RT54SX16 device, S/N B2, lot split P08W8 was irradiated starting June 1, 1998. The dose rate was at 1 kRad (Si) / Hour. The device was exposed to a total of 35 kRads (Si) with no measurable parametric changes. The test was terminated when the facility lost electrical power in a storm.
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Last Revised: January 09, 2002
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