Irradiation and Annealing Charts
LAN4901_02_KamikazeVCCAComposite.pdf
LAN49xx CompositeStripDataVCCA.pdf
Functional tests
Passed before and shortly (within 1 hour) after irradiation for LAN4903 through LAN4906; kamikaze devices (LAN4901 and LAN4902) failed basic in situ functional test at TID exceeding 100 krad (Si) (see LAN4901_02_KamikazeVCCA.pdf.)Propagation delays
Combinational Path - Rising Output, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
1434
1448
1479
1444
post-rad
1450
1458
1486
1451
Combinational Path -Falling 0utput, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
1439
1448
1476
1439
post-rad
1433
1439
1466
1430
SerialIn Path - Rising Output, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
56.1
56.5
57.1
56.2
post-rad
55.9
56.9
56.6
56.3
SerialIn Path -Falling 0utput, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
57.2
56.8
58.0
56.4
post-rad
57.7
56.9
58.1
57.6
SerialOut Path - Rising Output, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
54.9
54.9
55.5
55.3
post-rad
54.8
55.3
55.3
55.1
SerialOut Path Path -Falling 0utput, (ns)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
55.8
55.5
58.1
55.5
post-rad
56.4
55.5
56.5
56.0
Logic Threshold (V)
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
1.49
1.48
1.49
1.49
post-rad
1.50
1.52
1.50
1.50
Output Transition Time
Rising edge
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
post-rad
Falling edge
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
post-rad
Power -up Transient
Part #
LAN4903
LAN4904
LAN4905
LAN4906
pre-rad
post-rad
VOH/VOL
VOH
VOL
pre-rad
post-rad
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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz
