PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

LAN42xx RT54SX16

D/C 0031 - L/C T6HP12D 001

Total Dose Experiment

TID production chart: LAN42xx_Composite.pdf

LAN4206, LAN4207 annealing: lan42ann.jpg

TID kamikaze chart: LAN4202_03_SX16_T6HP12D2.pdf

Additional TID charts:

LAN4204, LAN4205 (I production run) lan4204_05.pdf

LAN4206, LAN4207 (II production run) lan4206_07.pdf

Important Notes

All TID and annealing charts reflect I_CC of a statically biased device in the same state (nominal) it was irradiated during the test. It was observed that all production devices (LAN4204 through LAN4207) biased in the state opposite to the nominal one registered I_CC values significantly (almost 100%) higher than in the nominal state; the effect was present immediately after irradiation as well as throughout annealing process. Furthermore, it was observed that most previously tested devices of this family demonstrate similar effect.

Different biasing was used for two devices in the kamikaze run. LAN4203 was biased dynamically (clocked at @ 1MHz, almost all elements of the device changing state with 0.5 MHz frequency); LAN4202 was biased statically.

Functional tests

Passed before and shortly (within 1 hour) after irradiation for LAN4204 through LAN4207; kamikaze devices (LAN4202 and LAN4203) failed basic in situ functional test (see kamikaze chart).

Propagation delays

Combinational Path - Rising Output, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	682	699	682	683
post-rad	681	699	683	685

Combinational Path -Falling 0utput, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	682	699	682	683
post-rad	673	689	674	674

SerialIn Path - Rising Output, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	52.3	52.6	52.2	52.0
post-rad	52.5	52.7	52.2	51.4

SerialIn Path -Falling 0utput, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	51.6	51.9	51.4	51.6
post-rad	51.4	51.6	51.3	51.7

SerialOut Path - Rising Output, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	51.7	52.6	51.5	51.7
post-rad	52.0	52.1	52.0	51.2

SerialOut Path Path -Falling 0utput, (ns)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	52.1	52.7	52.0	51.8
post-rad	51.9	52.6	51.7	51.7

Logic Threshold (V)

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	1.48	1.50	1.50	1.50
post-rad	1.49	1.45	1.45	1.44

Output Transition Time

Rising edge

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	L420XN00.gif	L420XN02.gif	L420XN04.gif	L420XN06.gif
post-rad	L420XP00.gif	L420XP02.gif	L420XP05.gif	L420XP06.gif

Falling edge

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	L420XN01.gif	L420XN03.gif	L420XN05.gif	L420XN07.gif
post-rad	L420XP01.gif	L420XP03.gif	L420XP04.gif	L420XP07.gif

Power -up Transient

Current @ 100 mA/Div
Voltage @ 1V/Div

Part #	LAN4204	LAN4205	LAN4206	LAN4207
pre-rad	L420XN09.gif	L420XN11.gif	L420XN13.gif	L420XN12.gif
post-rad	L420XP08.gif	L420XP09.gif	L420XP10.gif	L420XP11.gif

V_OH/V_OL

	V_OH	V_OL
pre-rad	prevoh.pdf	prevol.pdf
Post-rad	postvoh.pdf	postvol.pdf

Home
Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz

PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems, with a view to their practical solution.

LAN42xx RT54SX16

D/C 0031 - L/C T6HP12D 001

Total Dose Experiment

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.