PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

RT54SX16 Lot P05 Total Dose Test

LAN12xx Series

This lot of parts was fabricated in Matsushita's 0.6 µm CMOS process. New in situ tests have been added with in chamber functional tests and unloaded V_OH and V_OL measurements.

TID : LAN1221_22_31_32_33_RT54SX16P05TID.pdf

Hot Annealing : LAN1221_1222_HotAnneal_RT54SX16P05.pdf, LAN1200_HotAnnealling.PDF

Room Temp Annealing : LAN1200_Anneal.pdf

Delta Voh and Vol in situ : LAN1221_22_31_32_33_VohVol_In_Situ_RT54SX16P05.pdf

Propagation delay (Comb)

Rising Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	667	720	713	708	724	723
Post-rad	665	712	701	703	720	719
Post-ann	L	713	705	716	734	731

Falling Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	663	717	710	704	721	719
Post-rad	661	717	707	691	707	706
Post-ann	L	713	705	706	723	720

Propagation delay (SerIn)

Rising Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	42.3	42.2	42.2	44	45.1	45.4
Post-rad	42.6	44.1	44.2	41.9	43.2	42.4
Post-ann	L	42	42	43.5	44.3	45.0

Falling Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	42.6	42.8	43.1	45	46	46.3
Post-rad	42.7	45.6	44.9	42.8	42.0	43.7
Post-ann	L	43.5	42.6	45.0	45.9	46.2

Propagation delay (SerOut)

Rising Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	42.1	46.5	41.9	44	44.5	44.9
Post-rad	42.2	43.7	43.8	41.3	41.7	42.0
Post-ann	L	40.8	41.6	43.3	43.8	44.0

Falling Output (ns)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
Pre-rad	42.2	46.6	42.5	44.9	45.3	45.4
Post-rad	42.1	42.5	44.1	42.2	42.7	42.8
Post-ann	L	42	42.1	44.4	45.0	45.1

Output Edges

Output rising edge

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	L122XN00.gif	L122XN04.gif	L122XN05.gif	L123XN04.gif	L123XN03.gif	L123XN00.gif
post-rad	L122XR03.gif	L122XR11.gif	L122XR09.gif	L123XR05.gif	L123XR07.gif	L123XR03.gif
post-ann	L	L122XH03.gif	L122XH00.gif	L123XA06.gif	L123XA08.gif	L123XA10.gif

Output falling edge

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	L122XN01.gif	L122XN03.gif	L122XN02.gif	L123XN05.gif	L123XN02.gif	L
post-rad	L122XR04.gif	L122XR12.gif	L122XR10.gif	L123XR06.gif	L123XR08.gif	L123XR04.gif
post-ann	L	L122XH02.gif	L122XH01.gif	L123XA07.gif	L123XA09.gif	L123XA11.gif

Logic threshold (V)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	1.45	1.42	1.40	1.39	1.39	1.40
post-rad	1.40	1.40	1.40	1.35	1.35	1.37
post-ann	L	1.36	1.33	1.36	1.37	1.37

Output Stage I-V Curves

V_OH

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	LAN1200_Voh_0k.PDF
post-rad	LAN1200_Voh_75k.PDF
post-ann	L	LAN1200_Voh_HotAnneal.PDF		LAN1200_Voh_RoomTempAnneal.PDF

V_OH

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	LAN1200_Vol_0k.PDF
post-rad	LAN1200_Vol_75k.PDF
post-ann	L	LAN1200_Vol_HotAnneal.PDF		LAN1200_Vol_RoomTempAnneal.PDF

Power-on transient (100 mA/division)

Part #	CS	LAN1221	LAN1222	LAN1231	LAN1232	LAN1233
pre-rad	L122XN10.gif	L122XN11.gif	L122XN12.gif	L123XN06.gif	L123XN07.gif	L123XN08.gif
post-rad	L122XR00.gif	L122XR01.gif	L122XR02.gif	L123XR16.gif L123xr09.gif	L123XR15.gif L123xr12.gif	L123XR14.gif L123xr13.gif
post-ann	L	L122XH05.gif L122XH04.gif	L122XH07.gif L122XH06.gif	L123XA04.gif L123XA05.gif	L123XA02.gif L123XA03.gif	L123XA00.gif L123XA01.gif

Notes:

L - control sample lost due to an oops

Some Power-on transient pictures (all pre-rad and LAN 1221 and LAN1222 post-rad ) were taken with low sampling rate of the scope. As a result of the very narrow transient with this part type, we switched over to envelope mode on the scope.

Home
Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz

PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems, with a view to their practical solution.

RT54SX16 Lot P05 Total Dose Test

LAN12xx Series

This lot of parts was fabricated in Matsushita's 0.6 µm CMOS process. New in situ tests have been added with in chamber functional tests and unloaded VOH and VOL measurements.

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

This lot of parts was fabricated in Matsushita's 0.6 µm CMOS process. New in situ tests have been added with in chamber functional tests and unloaded V_OH and V_OL measurements.