PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

RT54SX32S Total Dose Experiment

LAN64xx, L/C T25JS001

Model: RT54SX32S

Lot Date Code: T25JS001

Package: CQ256

Bias: V_CCI = 5.0V; V_CCA = 2.5V

Pattern: TD_4Strings_SX32_DUT.htm

	S/N LAN6401, 02	S/N LAN6403, 04	S/N LAN6405, 06
Strip Chart, Time
Strip Chart, Rad
Power Cycle Test
VOH/VOL
ICCA
ICCI
tPD
Annealing

Glitch during the startup transient.   V_CCI was at 5.0V when V_CCA (shown) was powered.  Both traces are at 1V per division.

Passed before and after irradiation

 

Combinational Path - Rising Output, (ns)

Part #	LAN6401	LAN6402	LAN6403	LAN6404	LAN6405	LAN6406
pre-rad	379	372	370	367	377	381
post-rad	396	393	395	386	392	402

Combinational Path -Falling 0utput, (ns)

Part #	LAN6401	LAN6402	LAN6403	LAN6404	LAN6405	LAN6406
pre-rad	324	320	327	314	332	318
post-rad	340	333	338	330	340	333

Logic Threshold (V)

Part #	LAN6401	LAN6402	LAN6403	LAN6404	LAN6405	LAN6406
pre-rad	2.8	2.8	2.8	2.8	2.8	2.8
post-rad	2.8	2.8	2.8	2.8	2.8	2.8

	VOH	VOL
pre-rad	PreVoh.pdf	--
post-rad	PostVoh.pdf	--

Home
Last Revised: February 25, 2002
Digital Engineering Institute
Web Grunt: Richard Katz