NASA Rupture Test of SX-A/UMC and SX-SU FPGAs
UMC Die, 0.25 µm/SX32SU and 0.22 µm/SX32A
BNL, November, 2004
Summary
- This is an Single Event Effects test of the RTSX32SU, 0.25 µm, UMC die and A54SX32A, 0.22 µm die for heavy ion exposure. Only results from the unprogrammed rupture portion of the test will be reported here.
- The test was conducted at the Brookhaven National Laboratory on November 7, 2004 and was a joint effort between the NASA Office of Logic Design and Actel Corporation.
- Single event latch-up (SEL) is not detected in any run.
- Unprogrammed antifuse rupture was observed in multiple samples of both device types. Note that almost all antifuse devices have been seen to rupture over multiple manufacturers; the single exception is the 0.6 µm RTSX MEC FPGA. Test details are given in the table below. Current strip charts are given for all rupture events.
- Functional failure and intermittent operation was observed; most ruptures did not result in functional failure. This is an observation only limited to this experiment.
- The antifuse is constructed between the top two layers of metal. Thus, the penetration depth of heavy ions at the BNL facility is not an issue for unprogrammed antifuse rupture tests.
Test Date: November 7, 2004
Test Location: Brookhaven National Laboratory, Upton, NY
Ions Used
Br-81, 278.5 MeV
Ag-107, 316 MeV
I-127, 320 MeV
Test Patterns and DUTs
TMR
Die Type: SX-A/UMC
Package: PQ208
Wafer Lot Code: D14HS1
S/N: 7201, 7202, 7203, 7204, 7205, 7206
QCMON
Die Type: SX-SU
Package: CQ256
Wafer Lot Code: D122H1
S/N: 7101, 7102, 7103, 7104, 7105, 7106
Description: The RTSX32SU-CQ256 QCMon design has logical structures that reflect an aggressive user design. There are three fundamental types of blocks in the design. Each block has a Built-in Self Test (BIST) capability. The first block contains all available macro library guide C-Cell functions. The second block is Latch based 8x16 FIFO with a Finite State Machine to control the writing and reading functions. The third type of block is the I/O block. Each I/O block contains 4 user I/Os configured as bidirectional pins. Only one I/O in the I/O block will switch at a time; however there are 49 instantiated copies of this block. Therefore the design will have 49 simultaneously switching I/Os. The design utilizes 98.24% of the available C-Cells, 99.28% of the available R-Cells, 99.1% of the available user I/O pins, and 100% of the available routed clock and hardwired clock resources.
Shift
Die Type: SX-A/UMC
Package: PQ208
Wafer Lot Code: D14HS1
S/N: 7301
Device Cross Sections:
A54SX32A/UMC PQ208 RTSX32SU CQ256 Both these die have a polyimide type coating. In the plastic device this material may or may not be removed during encapsulation removal. For the ceramic device it is not removed by delidding. Bottom line, unless you know this material is specifically removed, consider it there. You may want to re-inspect the samples you tested. UPDATE: The formula for de-lidding the Actel parts was large volume "Reagent grade Red Fuming Nitric Acid" only, no Sulfuric mixture.
Testing was performed rotating the DUT in one direction for these tests. The main angle, which is normally used at BNL, is rotation, and is around a vertical axis as shown below. Roll was not used for this run and is about an axis that is perpendicular to the part - that is, in the direction of the beam.
++++++++++++++++++++++++++++++++++++++
+ +
+ DIE +
+ +
+ +
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^ ^
| |
PIN 1 |
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axis of rotation
(aspect ratio of SX-SU shown)The beam is going directly into the screen.
SEEBD4 DUT Card, RTSX72SUCQ256 DUT, and A54SX32APQ208/UMC DUT.
One SEEBD4 DUT card was modified for compatibility with the QCMON design.
Test set up at BNL. DUT is located in the cylindrical
vacuum chamber located in the center of the image.
Aggregate Data
(Runs with Rupture/Number of Runs)
| 2.75V | 3.0V | 3.2V | 3.4V | |
| Bromine | 0/4 | 0/12 | 0/12 | |
| Silver | 0/2 | 0/20 | 2/14 | 1/1 |
| Iodine | 1/20 | 7/20 |
Notes:
For Iodine w/ VCCA = 3.0V, three runs had 2 ruptures each and one run had 4 ruptures. The run with 4 ruptures was aborted at a fluence of 4.6 x 106 ions/cm2.
Aggregate Data
(Runs with Rupture/Number of Runs)
2.75V 3.0V 3.2V 3.4V Bromine 0° 0/2 0/6 0/6 ±45° 0/2 0/6 0/6 ±60° Silver 0° 0/1 0/10 1/5 ±45° 0/8 1/7 ±60° 0/2 0/2 1/1 Iodine 0° 0/10 0/10 ±45° 0/9 6/9 ±60° 1/1 1/1 Notes:
For Iodine w/ VCCA = 3.0V, ±45°, three runs had 2 ruptures each.
For Iodine w/ VCCA = 3.0V, ±60°, the one run with rupture had 4 ruptures. The run with 4 ruptures was aborted at a fluence of 4.6 x 106 ions/cm2.
RTSX32SU: QCMON Pattern
(Runs with Rupture/Number of Runs)
2.75V 3.0V 3.2V 3.4V Bromine 0/4 0/12 0/12 Silver 0/2 0/13 2/8 Iodine 1/12 4/12 Note: For Iodine w/ VCCA = 3.0V, one run had 2 ruptures, one run had 4 ruptures, and two runs had one rupture each. The run with 4 ruptures was aborted at a fluence of 4.6 x 106 ions/cm2.
A54SX32A/UMC: TMR and SHIFT Pattern
(Runs with Rupture/Number of Runs)
2.75V 3.0V 3.2V 3.4V Bromine Silver 0/7 0/6 1/1 Iodine 0/8 3/8 Note: For Iodine w/ VCCA = 3.0V, two runs had 2 ruptures each; the other run had one rupture.
Run History
BROMINE Run DeviceID Ion Range (µm) LET(Si)
(MeV-cm2/mg)Tilt (Degrees) VCCA
(volts)Time
(sec)Fluence
(p/cm2)Ruptures Notes and Strip Charts 12 7101 Br-81 36.03 37.46 0 2.75 92.6 1.01E+07 0 13 7101 Br-81 25.48 52.98 45 2.75 131.2 1.00E+07 0 14 7101 Br-81 36.03 37.46 0 3.00 92.7 1.00E+07 0 15 7101 Br-81 25.48 52.98 45 3.00 131.9 9.92E+06 0 16 7101 Br-81 36.03 37.46 0 3.20 93.2 1.00E+07 0 17 7101 Br-81 25.48 52.98 45 3.20 130.6 1.00E+07 0 18 7102 Br-81 36.03 37.46 0 2.75 88.9 1.00E+07 0 19 7102 Br-81 25.48 52.98 45 2.75 126.2 1.00E+07 0 20 7102 Br-81 36.03 37.46 0 3.00 88.3 1.00E+07 0 21 7102 Br-81 25.48 52.98 45 3.00 128.6 1.00E+07 0 22 7102 Br-81 36.03 37.46 0 3.20 90.6 1.00E+07 0 23 7102 Br-81 25.48 52.98 45 3.20 124.1 1.01E+07 0 24 7103 Br-81 36.03 37.46 0 3.00 86.5 1.00E+07 0 25 7103 Br-81 25.48 52.98 45 3.00 123.5 1.00E+07 0 26 7103 Br-81 36.03 37.46 0 3.20 87.9 1.01E+07 0 27 7103 Br-81 25.48 52.98 45 3.20 122.8 1.00E+07 0 28 7104 Br-81 36.03 37.46 0 3.00 87.9 1.00E+07 0 29 7104 Br-81 25.48 52.98 45 3.00 206.8 9.92E+06 0 30 7104 Br-81 36.03 37.46 0 3.20 97.4 1.02E+07 0 31 7104 Br-81 25.48 52.98 45 3.20 112.4 1.00E+07 0 32 7105 Br-81 36.03 37.46 0 3.00 85.1 1.00E+07 0 33 7105 Br-81 25.48 52.98 45 3.00 207.9 1.03E+07 0 34 7105 Br-81 36.03 37.46 0 3.20 186.4 1.01E+07 0 35 7105 Br-81 25.48 52.98 45 3.20 119 9.89E+06 0 36 7106 Br-81 36.03 37.46 0 3.00 100.8 1.00E+07 0 37 7106 Br-81 25.48 52.98 45 3.00 126.8 1.00E+07 0 38 7106 Br-81 36.03 37.46 0 3.20 89 1.00E+07 0 39 7106 Br-81 25.48 52.98 45 3.20 125.3 1.00E+07 0 40 7106 Br-81 36.03 37.46 0 2.75 100.2 9.76E+06 0
