Part: RT54SX72S
Package: CQ256
Pattern: TDSX72CQFP256_2Strings
Bias Voltages: 3.3V, 2.5V
In Situ Data
Functional tests
Passed before and shortly (within 1 hour) after irradiation for LAN6701 through LAN6704
Parametric Data
Table of In Situ Data
Part #
LAN6701
LAN6702
LAN6703
LAN6704
Stripchart (time)
6703_time 6704_time Stripchart (krad)
6703_rad 6704_rad ICCI @VCCA=0
6703_icci_vcca=0 6704_icci_vcca=0 ICCI
6703_icci 6704_icci ICCA
6703_icca 6704_icca Functional (comb)
6703_voh_vol 6704_voh_vol Functional (seq)
6703_ff 6704_ff Prop Delay
6703_tpd 6704_tpd "Annealing"J
Combinational Path - Rising Output, (ns)
Part #
LAN6701
LAN6702
LAN6703
LAN6704
pre-rad
1310
1280
1280
1290
post-rad
1360
1350
1340
1320
Combinational Path -Falling 0utput, (ns)
Part #
LAN6701
LAN6702
LAN6703
LAN6704
pre-rad
1100
1090
1100
1090
post-rad
1190
1150
1170
1130
Logic Threshold (V)
Part #
LAN6701
LAN6702
LAN6703
LAN6704
pre-rad
1.5
1.5
1.5
1.5
post-rad
1.5
1.5
1.5
1.5
Rising edge
Part # |
LAN6701 |
LAN6702 |
LAN6703 |
LAN6704 |
pre-rad |
||||
post-rad |
Falling edge
Part # |
LAN6701 |
LAN6702 |
LAN6703 |
LAN6704 |
pre-rad |
||||
post-rad |
VOH
VOL
Pre-rad
Post-rad
Pre-radiation Post-radiation tPHL 1100 1190 tPLH 1310 1360
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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz