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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


Total Dose Test Experiment - RT54SX32S

LAN45xx

L/C T25JSP03A

DUT Pattern = TD_4Strings_SX32_DUT.htm

Dose Rate = 1 krad(Si)/hr

Package = CQFP256

Bias Conditions: VCCI = 2.5VDC;   VCCA = 2.5VDC

LAN4501_RT54SX32S_4Strings.pdf
LAN4502_RT54SX32S_4Strings.pdf


DUT Pattern = TDSX32CQ256_DUT.htm

Dose Rate = 1 krad(Si)/hr

Package = CQFP256

Bias Conditions:

S/N LAN4521: VCCI = 5.0VDC;   VCCA = 2.5VDC
S/N LAN4522: VCCI = 3.3VDC;   VCCA = 2.5VDC

lan4521_22_stripchart_rt54sx32s.pdf

lan4521_bcwc_rt54sx32s.pdf

lan4522_bcwc_rt54sx32s.pdf

Notes: After irradiation, the part seems to like having the array powered up first and not the I/O.  Also, issues with functionality of the reset in.


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Last Revised: January 09, 2002
Digital Engineering Institute
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