PROGRAMMABLE TECHNOLOGIES WEB SITE

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

A54SX16A SEE Test

UMC Die, 0.22 µm

BNL, August, 2001

Summary

This is a test of the A54SX16A, 0.22 µm, UMC die.  This test was run with minimal supply voltages, 3.0/2.25 for all runs.  All runs resulted in what appeared to be single event latchup (SEL).  An LET of 15 MeV-cm2/mg (Chlorine) was the minimum LET used in this test set.

Package: PQ208

Serial Nos. LAN6101, LAN6102

L/C: DPF491

Test frequency: 1 MHz.

DUT schematics:  MKJ911

Total Number of Flip-flops: N/A, SEL, antifuse test.

Clock Configuration: N/A

Antifuse rupture: N/A, all runs resulted in SEL.

SEL: Detected.

Loss of control, i.e., JTAG upset: N/A, all runs resulted in SEL.

 

Test Data

All runs resulted in latchup with a bias of 3.0/2.25 volts.

Run # DeviceID Ion Energy
(MeV)		 Range
(µm)		 LET(Si)
MeV-cm2/mg		 Tilt
(deg)		 Strip Chart
               
377 6102 Cl-35 95 25.96 15.47 0  
374 6102 Cl-35 95 22.49 17.86 30 6102c2.pdf
375 6102 Cl-35 95 22.49 17.86 30 6102c3.pdf
373 6102 Cl-35 95 18.36 21.88 45 6102c1.pdf
369 6101 Br-81 278.5 36.03 37.46 0 6101b1.pdf
370 6101 Br-81 278.5 36.03 37.46 0 6101b2.pdf
371 6101 Br-81 278.5 36.03 37.46 0 6101b3.pdf
372 6102 Br-81 278.5 36.03 37.46 0 6102b1.pdf

Home
Last Revised January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz