The purpose of this test was to determine the approximate Single Event Latchup LETTH. Chlorine ions were used and SEL was detected at 22.9 MeV-cm2/mg; a run with a fluence of 107 p/cm2 at an LET of 16.2 MeV/cm2/mg finished. Upsets were recorded in the flip-flop cells.
The first run (Run No. 1) was excited with a zero pattern and latched up at a fluence of approximately 2 x 106 p/cm2. The DUT was at an angle of 60 degrees with respect to the beam, giving an LET of 22.9 MeV-cm2/mg.
The second run (Run No. 2) was excieted with a checkerboard data pattern and did not latch up. The fluence for the run was 107 p/cm2. The DUT was at an angle of 45 degrees with respect to the beam, giving an LET of 16.2 MeV-cm2/mg. A total of 385 upsets were detected.
Part Number: A500K050 (Prototype)
Lot Code: ZA934946/29104125
Package: PQFP208
Test Facility: Brookhaven National Labs
Test Date: October 20, 2000
Ions: 210 MeV Cl-35
Bias: Nominal Only - 3.3V (I/O) and 2.5V (Core)
S/N: LAN3303
The test pattern used had a total of 400 flip-flops. At an LET of 16.2 MeV-cm2/mg, 385 upsets were counted. At this LET, we can estimate the cross-section at 9.6 x 10-8.
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