A scientific study of the problems of digital
engineering for space flight systems,
with a view to their practical solution.
Two ORCA 2T15A devices were retested at Brookhaven National Lab. The primary goal of this test was a Single Event Latchup (SEL) evaluation.
A previous test in July, 2001, showed latchup. A post analysis of the test showed an error in the contractor's board with respect to the remote sensing on the power supply. As a result, we repaired the board and retested. The outcome of the test was not significantly different other than the observation of very large latchup currents, in some cases exceeded 2A.
Part Markings
OR2T15A-3
S240 99870
9833K88A
9987088A
2T15A 9832KDevice Bias
VCCIO = 5.5 VDC, VCCCore = 3.6 VDC for the maximum case
VCCIO = 4.5 VDC, VCCCore = 3.0 VDC for the minimum caseDevice Temperature
Nominal
Run # DeviceID Ion Energy
(MeV)Range
umLET(Si)
MeV.cm2/mgTilt (deg) Voltage Comments
385 orca1 Cl-35 95 25.96 15.47 0 5.5/3.6 Latch: Increase in steps up to 1A 386 orca1 Cl-35 95 25.96 15.47 0 5.5/3.6 Latch: Two steps, first up 20 mA then up to 1A 380 orca1 Cl-35 95 12.98 30.94 60 5.5/3.6 Latch 381 orca1 Cl-35 95 12.98 30.94 60 4.5/3.0 Latch 382 orca1 Cl-35 95 12.98 30.94 60 4.5/3.0 Latch 383 orca1 Cl-35 95 12.98 30.94 60 4.5/3.0 Latch @ ~ 200 mA 384 orca1 Cl-35 95 12.98 30.94 60 4.5/3.0 Latch @ ~200 mA 378 orca2 Cl-35 95 12.98 30.94 60 5.5/3.6 Latch: Overcurrent @ 800 mA 379 orca2 Cl-35 95 12.98 30.94 60 5.5/3.6 Latch: overcurrent, overvoltage 298 orca2 Br-81 278.5 36.03 37.46 0 5.5/3.6 Latch: Overcurrent @ 800 mA 299 orca2 Br-81 278.5 36.03 37.46 0 5.5/3.6 Latch: Overcurrent @ 2A
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Last Revised:
January 19, 2003
Digital Engineering Institute
Web Grunt: Richard Katz
