An A42MX36 devices was tested at Brookhaven National Lab, using Bromine at normal incidence, for an LET = 38.1 MeV-cm2/mg. VCC was set to a nominal 5.0VDC. All runs resulted in the device latching, almost instantly. An attempt was made to find the latchup sensitive region by masking the part; this effort failed. The results and current strip charts are shown in the table below. Because of the low LET latchup, cross-section information and latchup threshold was not measured. A flux of approximately 1.2 x 105 p/cm2/sec was used for all runs. Latchup currents, for some runs, exceeded two amps.
Package: PQFP208
D/C: 9826
L/C: 2ACT14014.1
S/N: LAN2301
| Device S/N | Run Number | VCC | Latch | Area Open |
Strip Chart |
LAN2301 |
42 | 5.0 | Yes | All | |
LAN2301 |
43 | 5.0 | Yes | All | |
LAN2301 |
44 | 5.0 | Yes | All | |
LAN2301 |
45 | 5.0 | Yes | Bottom 1/3 of die | 2301Run45.pdf |
LAN2301 |
46 | 5.0 | Yes | "Sliver" on top | 2301Run46.pdf |
LAN2301 |
47 | 5.0 | Yes | "Sliver" on right | 2301Run47.pdf |
LAN2301 |
48 | 5.0 | Yes | Small hole in the center of die | 2301Run48.pdf |
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Last Revised: January 09, 2002
Digital Engineering Institute
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