| Run # | Run ID | Bias Voltage | Effective LET (MeV-cm2/mg) | Fluence (ions/cm2) | Latch | Comments |
| R35 | CX1T1 | 5.5 | 18.8 | 107 | No | 7 Upsets |
| R38 | CX2T1 | 5.5 | 18.8 | 107 | No | 2 Upsets |
| R37 | CX1T3 | 5.5 | 22.0 | Yes | Moderate Quick Latch | |
| R40 | CX2T3 | 5.5 | 22.0 | Yes | Immediate Latch | |
| R36 | CX1T2 | 5.5 | 26.5 | Yes | Quick Latch | |
| R39 | CX2T2 | 5.5 | 26.5 | Yes | Immediate Latch | |
| R10 | CX1B1 | 4.5 | 37.1 | Yes | ||
| R11 | CX1B2 | 4.5 | 37.1 | Yes | Immediate Latch | |
| R12 | CX2B1 | 4.5 | 37.1 | Yes | Immediate Latch |
The SEL threshold for this lot of parts is approximately 20 MeV-cm2/mg. Latch currents ranged from ~ 150 mA to > 800 mA.
The SEU threshold was not found for this lot but a small cross-section was measured at an LET of 18 MeV-cm2/mg. This DUT pattern utilized 1,200 flip-flops so a single cross-section measurement, at an LET of 18 MeV-cm2/mg, is: 0.4 x 10-9 cm2/flip-flop.
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Last Revised: March 13, 2003
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