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A54SX32 Heavy Ion Antifuse Test BNL

April 1999

 

Detailed Data from the A54SX32 Heavy Ion Antifuse Test at BNL, May, 1999

Two groups of A54SX32 prototype devices (lot split based on antifuse "recipe") were tested with varying bias.  The parts are grouped by lot split into the LAN1500 and LAN1600 serial number range.  All devices were tested with I-127 at 341 MeV, which yields a range of 32.5 um and an LET of 59.8(Si) MeV cm2/mg. All tests were run with the DUT normal to beam on May 2, 1999 at Brookhaven National Laboratory's tandem Van de Graff accelerator facility.

Run # Device
Serial
Number		 Flux
p/cm2/sec		 Fluence
p/cm2		 Antifuse
Rupture		 Bias Voltage Strip Chart Rupture Current
(mA)
199  

LAN1501

 

 128.2e+3 107   2.8    
200 141.1e+3 107   2.9    
201 145.5e+3 107 Twice 3.0 1501.pdf 16.8
15.5
 
202


LAN1502

 144.5e+3 107   2.8    
203 143.4e+3 107 Once 2.9 1502.pdf 21.4
 
204  

LAN1503

 

 147.9e+3 107   2.8    
205 144.9e+3 107   2.9    
206 144.2e+3 1.5 x 106 Once 3.0 1503.pdf 11.4
 
207  

LAN1601

 

 142.7e+3 107   2.8    
208 145.5e+3 107   2.9    
209 147.9e+3 107 Four Times 3.0 1601.pdf 9.5
7.5
33.9
22.3
 
210 LAN1602 141.9e+3 107 Twice 2.9 1602.pdf 11.2 13.3
 
211 LAN1603 123.0e+3 107 Once 2.8 1603.pdf 11.4

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