Total Dose at various current levels [exposed @ 5 kRads (Si) / Day ]:
| Icc (mA) | Dose (kRads) |
| 5 | 13.4 |
| 10 | 15.1 |
| 20 | 17.0 |
| Pre-Test | Post 35 kRads (Si) | Post Room Temp Anneal (336 Hours) | Post 100C Anneal (133 Hours) | |
| Tpd | 2.856 uSec | 3.134 uSec | 2.94 uSec | |
| Iccstdby | 130 uA | 159 mA | 58 mA (74 mA @ 168 hours) | 230 uA |
| Logic Threshold | 1.35 V | 1.25 V | 1.25V |
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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz