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A1425A Heavy Ion Test

Brookhaven National Labs

November, 1998

Summary

A heavy ion test was conducted at Brookhaven National Labs in November, 1998.   Four A1425A devices were screened for single event latchup (SEL) and antifuse rupture.  No failures were detected.

Detailed Test Results

S/N LAN207, LAN208, LAN209, and LAN210 were subjected to antifuse rupture tests and single event latchup tests.  The lot code for these devices is UCJ014X and the lot date code is 9819.  All exposures were done at worst case bias conditions, V_CC = 5.5 VDC.  All runs used Bromine with a fluence per run of 10⁷ ions/cm².

Latchup

These runs were conducted with the beam at an angle of 60 degrees, giving an effective LET of 74 MeV-cm²/mg.  No failures were detected.

Antifuse Rupture

These runs were conducted with the beam at an angle of 0 degrees, which is the worst-case for this effect, as the "cosine" rule does not apply to this failure mechanism.  No failures were detected.

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