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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

A14100A/MEC UCL055 Test

Parametric Data

 

Parts were tested up to 11 krads (Si), at 4 krads (Si)/day.  This was followed by a room temperature anneal and then a 100 ºC anneal.  Both anneals were for approximately 168 hours.

LAN 101(control sample), LAN 109, LAN110, LAN111 testing.

 Table 1. Functional Test.
  prerad postrad room T ann. hot ann.
LAN101 passed passed passed passed
LAN109 passed passed passed passed
LAN110 passed passed passed passed
LAN111 passed passed passed passed

 

Table 2. Propagation delay rising edge (ns)

  prerad Postrad room T ann. hot ann.
LAN101 281.2 282.6 282.9 283.4
LAN109 285.7 292.2 292.5 290.4
LAN110 275.5 281.2 281.6 280.3
LAN111 279.9 285.7 285.9 284.0

 

Table 3. Propagation delay falling edge (ns)

  prerad postrad room T ann. hot ann.
LAN101 283.6 284.9 285.3 285.2
LAN109 288.3 298.0 298.0 291.7
LAN110 278.0 287.0 287.0 281.4
LAN111 282.4 291.3 291.2 285.2

 

Table 4. Logic Threshold Voltage (V)

  prerad postrad room T ann. hot ann.
LAN101 1.43 1.43 1.42 1.42
LAN109 1.43 1.43 1.42 1.40
LAN110 1.42 1.42 1.42 1.39
LAN111 1.42 1.42 1.43 1.40

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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz