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A scientific study of the problems of
digital engineering for space flight systems,
with a view to their practical solution.
LAN1xx A14100A
L/C UCL055
Total Dose Experiment - "4Strings"
Summary
The purpose of this experiment is to investigate the effect of logical state of an
internal device node during a radiation test on ICC leakage.
This special pattern has 4 strings of combinational gates controlled by a 16-state
sequential circuit; each bit of the 4-bit sequencer drives one of the four strings of
combinational logic. During the irradiation the device is kept in the home state
('1000'). The controller is cycled through all sixteen states once each hour with
the automated sequencing taking approximately 20 seconds, thus, putting the 4 strings
through all possible combinations of biases. ICC leakage is measured and
recorded for all 16 combinations of biases.
In this test of Act 3 (0.8 µm) technology, no significant effects were noticed.
Significant effects have been noticed in SX (0.6 µm) and SX-S (0.25 µm)
technology devices.
Date = January 24, 2001
Bias = 5VDC
Package = 256CQFP
Dose Rate = 1 krad(Si)/hour
Facility = GSFC
Pattern = TD_4Strings_A14100A_DUT.htm
S/N LAN171
LAN171_A14100A_4Strings_5MinData.pdf
LAN171_A14100A_4Strings.pdf
LAN171_A14100A_4Strings_Zoom.pdf
S/N LAN172
LAN172_A14100A_4Strings_5MinData.pdf
LAN172_A14100A_4Strings.pdf
LAN172_A14100A_4Strings_Zoom.pdf
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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz