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LAN52xx RT1280A

D/C 0043 - L/C U1H609 001

Total Dose Experiment

In situ and Annealing Charts

ICC Monitoring

LAN5201_02 KamikazeFail.pdf

LAN52xxComposite.pdf

Best-Case/Worst-Case

BC_WC_01_02.pdf

BC_WC_01_02_Zoomed.pdf

BC_WC_01_02_To_Failure.pdf

BC_WC_03_04.pdf

BC_WC_03_04_Zoomed.pdf

BC_WC_05_06.pdf

BC_WC_05_06_Zoomed.pdf

Functional and VOUT Monitors

LAN5201_02 KamikazeFailFT.pdf

LAN5203_04FT.pdf

LAN5205_06FT.pdf

Annealing

Anneal.pdf

Anneal_LogLog.pdf

 

Functional tests

Passed before and shortly (within 1 hour) after irradiation for LAN5203 through LAN5206; kamikaze devices (LAN5201 and LAN5202) failed basic in situ functional test at TID > 30 krad (Si).

 

 

Note: All Parametric Tests Are Conducted After Annealing

 

Propagation delays

Combinational Path - Rising Output, (ns)

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

1295

1324

1309

1366

post-rad

1304

1329

1305

1362

Combinational Path -Falling 0utput, (ns)

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

1287

1316

1297

1358

post-rad

1282

1299

1281

1329

 

Logic Threshold (V)

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

1.36

1.37

1.34

1.36

post-rad

1.32

1.33

1.34

1.34

 

 

Output Transition Time

Rising edge

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

L520XN00.gif

L520XN02.gif

L520XN06.gif

L520XN08.gif

post-rad

L520XP00.gif

L520XP02.gif

L520XP04.gif

L520XP06.gif

Falling edge

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

L520XN01.gif

L520XN03.gif

L520XN07.gif

L520XN09.gif

post-rad

L520XP01.gif

L520XP03.gif

L520XP05.gif

L520XP07.gif

 

Power -up Transient

Part #

LAN5203

LAN5204

LAN5205

LAN5206

pre-rad

L520XN04.gif

L520XN05.gif

L520XN10.gif

L520XN11.gif

post-rad

L520XP08.gif

L520XP09.gif

L520XP10.gif

L520XP11.gif

 

VOH/VOL vs. IOH/IOL

VOH

VOL

pre-rad

PreVoh.pdf

PreVol.pdf

post-rad

PostVoh.pdf

PostVol.pdf

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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz