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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

LAN47xx RT1280A

Total Dose Experiment

Package: CQFP172

Parametric Data: All parametric data taken after annealling.

Graphs

LAN4701_02_Kamikaze.pdf

LAN4701_02_Kamikaze_krad.pdf

LAN4701_02_Kamikaze_ZoomIn.pdf

LAN4701_02_Vout.pdf

LAN4701_02_Vout_HiRes.pdf

LAN4701_BC_WC.pdf

LAN4701_BC_WC_Zoom1.pdf

LAN4701_BC_WC_Zoom2.pdf

LAN4702_3_4_5_6_krads.pdf

LAN4703_04_krads.pdf

LAN4703_04_outputs.pdf

LAN4703_04_Time.pdf

LAN4705_06_krads.pdf

LAN4705_06_outputs.pdf

LAN4705_06_Time.pdf

LAN4703_04_ann.jpg

LAN4705_06_ann.jpg

Passed before and shortly (within 1 hour) after irradiation for LAN4703 through LAN4706; kamikaze devices (LAN4701 and LAN4702) failed basic in situ functional test at TID > 60 krad (Si).

Part #	LAN4703	LAN4704	LAN4705	LAN4706
pre-rad	1.33	1.34	1.35	1.37
post-rad	1.30	1.31	1.30	1.31

Part #	LAN4703	LAN4704	LAN4705	LAN4706
pre-rad	L470XN05.gif	L470XN04.gif	L470XN11.gif	L470XN10.gif
post-rad	L470XP00.gif	L470XP01.gif	L470XP02.gif	L470XP03.gif

	VOH	VOL
pre-rad	PreVoh.pdf	PreVol.pdf
post-rad	PostVoh.pdf	PostVol.pdf

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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz