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LAN80x A1020Z U1RT02 25

Total Dose Experiment

TID : lan80x_TDose.pdf

Annealing : lan80x_Anneal.pdf

Propagation delay (ns)

Part #	LAN801	LAN802	LAN803	LAN804	LAN805
pre-rad	74.9	74.4	75.1	74.7	75.2
post-rad	74.7	74.0	75.3	74.1	74.7
post-ann	75.6	74.0	75.3	75.4	75.7

Logic threshold

1.7 V unchanged throughout testing.

Output rising edge

Part #	LAN801	LAN802	LAN803	LAN804	LAN805
pre-rad	LAN80005.gif	LAN80006.gif	LAN80007.gif	LAN80008.gif	LAN80009.gif
post-rad	LAN80P05.gif	LAN80P06.gif	LAN80P07.gif	LAN80P08.gif	LAN80P09.gif
post-ann	L80X_A01.gif	L80X_A03.gif	L80X_A05.gif	L80X_A07.gif	L80X_A09.gif

Output falling edge

Part #	LAN801	LAN802	LAN803	LAN804	LAN805
pre-rad	LAN80000.gif	lost	LAN80002.gif	LAN80003.gif	LAN80004.gif
post-rad	LAN80P00.gif	LAN80P01.gif	LAN80P02.gif	LAN80P03.gif	LAN80P04.gif
post-ann	L80X_A00.gif	L80X_A02.gif	L80X_A04.gif	L80X_A06.gif	L80X_A08.gif

V_OL/V_OH (post-anneal measurements only)

For V_OL: Voltage in data table is measured from 5.0V to the output pin.

Part #	LAN801	LAN802	LAN803	LAN804	LAN805
Voh	LAN801Voh.dat	LAN802Voh.dat	LAN803Voh.dat	LAN804Voh.dat	LAN805Voh.dat
Vol	LAN801Vol.dat	LAN802Vol.dat	LAN803Vol.dat	LAN804Vol.dat	LAN805Vol.dat

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Last Revised: January 09, 2002
Digital Engineering Institute
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