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RH1020 Total Dose Test RH1020-CQ84V

D/C 9839- L/C 5962F9096505QTCOJ4Z0

 

This lot of parts was fabricated at Lockheed-Martin Federal Systems.

 

TID: There was no change in ICC during the irradiation a level of 125 krad (Si). The dose rate was 12.95 rad (min) in a Cobalt-60 facility. The parts were monitored (ICC) in situ and were in a Pb/Al box per Method 1019.5.

 

Propagation Delay:

Rising Output (ns)

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

260

269

261

264

261

Post-rad1

259

265

259

   

Post-rad2

259

   

262

259

Falling Output (ns)

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

232

235

231

230

229

Post-rad1

232

241

238

   

Post-rad2

231

   

236

235

 

 

Output Edges:

Output Rising Edge

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

170XN00

170XN02

170XN04

170XN06

170XN08

Post-rad1

170XR00

170XR02

170XR04

   

Post-rad2

170XRR01

   

170XRR03

170XRR06

Output Falling Edge

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

170XN01

170XN03

170XN05

170XN07

170XN09

Post-rad1

170XR01

170XR03

170XR05

   

Post-rad2

170XRR00

   

170XRR02

170XRR05

 

 

 Logic Threshold

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

1.71

1.72

1.71

1.72

1.72

Post-rad1

1.74

1.72

1.71

   

Post-rad2

1.65

   

1.64

1.64

 

 

Output Drive

VOH

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Post-rad

170x Voh

VOL

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Post-rad

170x Vol

 

 

Power-on Transient (ICC)

Scale = 1V/Div; 100 mA/Div

Part #

CS (LAN1705)

LAN1701

LAN1702

LAN1703

LAN1704

Pre-rad

L170XN14

L170XN10

L170XN11

L170XN12

L170XN13

Post-rad

L170XR06

L170XR07

L170XR08

L170XR09

L170XR10

 

Note:

For most tests, the parts were irradiated and tested in two batches with the control sample also tested with each batch. This was done as a result of the limited capacity of the radiation chamber; only two samples could be irradiated at a time.


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Last Revised: January 09, 2002
Digital Engineering Institute
Web Grunt: Richard Katz