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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

A1020 MA-JB52 Total Dose Test

Three A1020 2.0 µm devices have been subjected to a total dose screen to determine the general properties of this lot. 

   Package:      CPGA84

   Date Code:   9015

   Lot:          MA-JB52/I-16AA

The doese rate for all devices was 1 krad (Si)/hour and I_CC was constantly monitored. 

S/N BET001 and BET002 were irradiated to 230 krads (Si) and 200 krads (Si) with a change in Icc of less than 1 mA; both devices were functional after irradiation.

S/N BET003 was irradiated to 24 krads (Si) with a current increase of <= 1 mA; no change was detected.  The device was functional after irradiation and no change in propagation delay was measured.

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Last Revised: January 09, 2002
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