CHANGE OF TRI-STATE LEAKAGE LIMITS FOR ACTEL A54SX72A AND A54SX32A DEVICES
Problem Description: This is to inform Actel customers that during further characterization of the A54SX32A and the A54SX72A Field Programmable Gate Arrays (FPGA), it was determined that the tri-state leakage value of ± 10 micro amps (mA) was understated in the datasheet. In order to reflect the statistically correct value, taking into account lot-to-lot and operating temperature variances, Actel is adjusting the limit to ± 20 mA. There is no functionality or reliability impact to these devices. This specification is only being modified to reflect the device characteristics. The exact changes are
For 5V TTL & 3.3V LVTTL I/O operations, the IIH, IIL, & IOZ are changed from ± 10 mA to ± 20 mA.
For 3.3V PCI I/O operation, the IIH and IIH are changed from ± 10 mA to ± 20 mA.
Action: A survey was conducted from October to December 2002, to all known SXA customers to evaluate potential impact of the changes and received no objection from customers. Therefore, starting December 16, 2002 ship date, all devices will be shipped with tri-state leakage limit adjusted to ± 20 mA. A list of the part numbers for affected devices are attached on page 2 of this advisory.An updated datasheet has been posted on Actel website (http://www.actel.com). Associated SMDs (5962-00543 and 5962-01518) have also been updated and posted on DSCC website.
This change applies to the following products:
A54SX32A-CQ208M
A54SX32A-1CQ208M A54SX32A-CQ208B
A54SX32A-1CQ208B A54SX32A-CQ256M
A54SX32A-1CQ256M A54SX32A-CQ256B
A54SX32A-1CQ256B A54SX72A-CQ208M
A54SX72A-1CQ208M A54SX72A-CQ208B
A54SX72A-1CQ208B A54SX72A-CQ256M
A54SX72A-1CQ256M A54SX72A-CQ256B
A54SX72A-1CQ256B Plus the following SMD device part numbers:
Device Name
DSCC SMD A54SX32A-CQ256B
5962-0151801QXC A54SX32A-1CQ256B
5962-0151802QXC A54SX32A-CQ208B
5962-0151801QYC A54SX32A-1CQ208B
5962-0151802QYC A54SX72A-CQ256B
5962-0054301QXC A54SX72A-1CQ256B
5962-0054302QXC A54SX72A-CQ208B
5962-0054301QYC A54SX72A-1CQ208B
5962-0054302QYC
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Last Revised: December 18, 2002
Digital Engineering Institute
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