Steven Moss and Stephen LaLumondiere
Crosslink, Summer 2003
In the past 10 years, Aerospace has developed a state-of-the-art
facility that uses picosecond laser pulses to simulate the
transient effects of energetic particles striking microelectronic devices. This
system is used to diagnose radiation-hardened
designs and to validate radiation-hardening techniques for mitigating the effects of space
radiation on integrated circuits.
Copyright © 2003 The Aerospace Corporation. All rights reserved. Permission to copy or reprint is not required but credit must be given to The Aerospace Corporation
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