Abstract
Missions for the space environment differ from those of many terrestrial applications since they are presented with a radiation
environment and long life requirements. Additionally, maintenance operations are extremely expensive if possible at all. The
fundamentals of the radiation environment and radiation test techniques will be reviewed. Detailed specifications and failure
modes will be analyzed, for each class of device and technology. Figures of merit will be given for specific devices in use. Design
techniques to provide reliable operation in the radiation environment will be discussed as well as the analysis of device reliability
issues such as single point failures and how to avoid them.Course (.ppt version; click for pdfversion)
Presentation Material
Hardcopy Material
- Introduction
- Total Dose
- Single Event Upset (SEU)
- Single Event Latchup (SEL)
- Single Event Transient (SET)
- Antifuse Rupture
- Protons
- Loss of Functionality
- Miscellaneous
- Correction Techniques
- Definitions
.pdf version (courtesy of Paul S. Graham, Los Alamos National Laboratory)
Presentation Material
Hardcopy Material
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Last Revised:
May 05, 2005
Web Grunt:
Richard Katz
