NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

ProASIC Reliability: April 2002

2001-12-01_0.25um_flow.pdf	0.25 um FLASH FPGA Process Flow
Assy_Process_Summary.pdf	ASSEMBLY PROCESS SUMMARY A500K050-PQ208, A500K130-PQ208, A500K180-PQ208, A500K270-PQ208
flash_cell_structure.pdf	0.25um FLASH FPGA, Process Technology, Actel - Infenion
a500k_130_esd_test.pdf	ProASIC A500K130 ESD Test Results
pro_asic_see_rpt110601.pdf	ProASIC Single-Event Effects - First Update, November 6, 2001
1-8a-11372_A500K270-PQ208_ProAsic_Bonding_Diagram.pdf 1-8a-11373_A500K180-PQ208_ProAsic_Bonding_Diagram.pdf 1-8a-11374_A500K130-PQ208_ProAsic_Bonding_Diagram.pdf 1-8a-11375_A500K050-PQ208_ProAsic_Bonding_Diagram.pdf 1-8a-11427_A500K130-BG272_Bonding_Diagram_(ASAT).pdf 1-8a-11429_A500K130-BG456_Bonding_Diagram_(AMKOR).pdf 1-8a-11431_A500K050-BG272_Bonding_Diagram_(ASAT).pdf 1-8a-11432_A500K270-FG676_Bonding_Diagram.pdf 1-8a-11435_A500K270-BG456_Bonding_Diagram_(AMKOR).pdf 1-8a-11436_A500K180-BG456_Bonding_Diagram_(AMKOR).pdf	Bonding Diagrams
a500k270_characterization_report_rev_1.0.pdf	ProASIC A500K270 Characterization Report  (Rev. 1.0)
pa-029_a500k130_device_qualification_summary.pdf pa034_a500k270_qualificatiion_summary.pdf	Qualification Summaries
publish_dates.pdf reliability_report_q3-2001_flash.pdf	Reliability Summary
ProasicDS.pdf Publish dates.pdf	Data Sheet

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Last Revised: April 11, 2003
Digital Engineering Institute
Web Grunt: Richard Katz