NASA Office of Logic Design

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

Testing Summary: NASA Test of Actel SX-A, SX-S and SX-SU FPGAs

Related Information: tPD Summary

Jump to The Aerospace Corporation Space Qualification Life Test

Lot Test ID Device Temp Units Duration
(hours)		 Device
Hours		 Cum.
Device
Hours		 Notes and Significant Anomalies
KU1 KU1-0 RTSX32SU-CQ208B   150   0      0       0 KU1 Anomaly Summary
KU1-1 RTSX32SU-CQ208B +125 ºC 150 250 37,500  37,500  
KU1-2 RTSX32SU-CQ208B +125 ºC 150 250 37,500  75,000  
KU1-3A RTSX32SU-CQ208B  -55 ºC 150 115 17,250  92,250 S/N 50956: Single S Antifuse
KU1-3B RTSX32SU-CQ208B  -55 ºC 149  55  8,195 100,445  
KU1-3C RTSX32SU-CQ208B  -55 ºC 149  80 11,920 112,365  
KU1-4 RTSX32SU-CQ208B +125 ºC 149 250 37,250 149,615  
KU1-5 RTSX32SU-CQ208B +125 ºC 149 250 37,250 186,865  
KU1-6 RTSX32SU-CQ208B +125 ºC 149 250 37,250 224,115 VCCA = 3.0V
KU1-7 RTSX32SU-CQ208B  -55 ºC 149 250 37,250 261,365 VCCA = 3.0V
 
KU2 KU2-0 RTSX32SU-CQ208B   150   0      0       0 KU2 Anomaly Summary
KU2-1 RTSX32SU-CQ208B +125 ºC 150 250 37,500  37,500  
KU2-2 RTSX32SU-CQ208B +125 ºC 150 250 37,500  75,000  
KU2-3 RTSX32SU-CQ208B +125 ºC 150 250 37,500 112,500  
KU2-4 RTSX32SU-CQ208B +125 ºC 150 250 37,500 150,000  
KU2-5 RTSX32SU-CQ208B  -55 ºC 149 250 37,250 187,250  
KU2-6 RTSX32SU-CQ208B  -55 ºC 149 250 37,250 224,500 VCCA = 3.0V
KU2-7 RTSX32SU-CQ208B +125 ºC 149 250 37,250 261,750 VCCA = 3.0V
 
KM1 KM1-0 RT54SX32S-CQ208B   150   0      0       0 KM1 Anomaly Summary
S/N 37887: Func. Fail @ Cold (K antifuse)
KM1-1A RT54SX32S-CQ208B +125 ºC 150  50  7,500   7,500  
KM1-1B RT54SX32S-CQ208B +125 ºC 150 200 30,000   37,500 S/N 37858: Failed functional array testing. (K antifuse)
KM1-2 RT54SX32S-CQ208B +125 ºC 149 250 37,250 74,750  
KM1-3 RT54SX32S-CQ208B +125 ºC 149 250 37,250 112,000   
KM1-4 RT54SX32S-CQ208B +125 ºC 149 250 37,250 149,250  
KM1-5 RT54SX32S-CQ208B  -55 ºC 149 250 37,250 186,500 S/N 37990: tPD anomaly (F antifuse)
 
KM2 KM2-0 RT54SX32S-CQ208B   150   0      0       0 KM2 Anomaly Summary
KM2-1A RT54SX32S-CQ208B +125 ºC 150  50  7,500   7,500  
KM2-1B RT54SX32S-CQ208B +125 ºC 150 200 30,000   37,500  
KM2-2 RT54SX32S-CQ208B +125 ºC 150 250 37,500   75,000  
KM2-3 RT54SX32S-CQ208B +125 ºC 150 250 37,500 112,500  
KM2-4 RT54SX32S-CQ208B +125 ºC 150 250 37,500 150,000 S/N 38014 - tPD anomaly: Single S Antifuse
KM2-5 RT54SX32S-CQ208B  -55 ºC 150 250 37,500 187,500 S/N 27869 I/O monitor not toggling, cause not determined.
 
KU3 KU3-0 RTSX32SU-CQ208B   150       Procurement awarded.
 
KU4 KU4-0 RTSX32SU-CQ208B   150       Procurement awarded.
 
KM3 KM3-0 RT54SX32S-CQ208B   150   0      0      0 Modified new algorithm.
KM3 Anomaly Summary
KM3-1 RT54SX32S-CQ208B +125 ºC 150 250 37,500 37,500  
KM3-2 RT54SX32S-CQ208B +125 ºC 150 250 37,500 75,000  
KM3-3 RT54SX32S-CQ208B +125 ºC 150 250 37,500 112,500  
KM3-4 RT54SX32S-CQ208B +125 ºC 150 250 37,500 150,000  
KM3-5 RT54SX32S-CQ208B  -55 ºC 150 250 37,500 187,500 One anomaly, array shift register failure, F antifuse.
 
KM4 KM4-0 RT54SX32S-CQ208B   150   0      0      0 Modified new algorithm.
S/N 80063: K Antifuse
KM4-1 RT54SX32S-CQ208B +150 ºC 150 250 37,500 37,500 Testing error, devices biased at +150 ºC.  No antifuse damage detected, leakage currents increased.

Notes

  1. KU1 and KU2 use the UMC standard algorithm.

  2. KU3 and KU4 use the UMA (UMC Modified Algorithm) and SAL ( S antifuse Loading).  For more information, see slides 9 and 10 from the following presentation (Single S-Antifuse and Programming Update) from the briefing held in May 2005 .

  3. KM1 and KM2 use the MEC "new programming algorithm."

  4. KM3 and KM4 use the MEC "modified new programming algorithm."

  5. Electrical Environment: VCCA=3.0V; Undershoot (average) = -1.0 volts.  CLKIO = 8 MHz (57 SSO's); CLKArray = 32 MHz (100 % toggling); Delay Line = 1 MHz.

  6. KU3 and KU4 will use the NASA2 Design for the DUT pattern.

 

The Aerospace Corporation Space Qualification Life Tests

Part Type Units Routing and Programming Algorithm
(2,3)		 Temp 500
Hours		 500
Hours		 1,000
Hours		 1000
Hours		 1000
Hours		 1000
Hours		 1000
Hours		 Cumulative Device Hours (5)
RTSX32SU 150 Standard +125 ºC Pass Pass 2 Fail (4) Pass Pass       596,000
RTSX72SU  75 Standard  -55 ºC Pass Pass Pass Pass Pass       630,000
RTSX72SU  79 UMA + SAL +125 ºC Pass Pass Pass 1 Fail (5)         497,700
RTSX32SU 154 UMA + SAL  -55 ºC Pass Pass Pass Pass         462,000
Cumulative
Test
Hours		   500 1,000 2,000 3,000 4,000 5,000 6,000 2,185,700

Notes

  1. All tests run at VCCA = 2.5V, VCCI = 5.0V, and undershoot < 1.5V.

  2. UMA = UMC Modified Algorithm.  For more information, see slide 9 from the following presentation from the briefing held in May 2005 Single S-Antifuse and Programming Update.

  3. SAL = S antifuse Loading.    For more information, see slide 10 from the following presentation from the briefing held in May 2005 Single S-Antifuse and Programming Update.

  4. Two single B antifuse failures

  5. One K antifuse failure in a shift register application

  6. Device hours are given in "SX32S" equivalents to make the data comparable with other test sets such as the Industry Tiger Team's and the NASA test.  The "SX72S" is counted as 2.1 "SX32S" devices which is based on the ratio of logic modules.

  7. "Space Qualification Test (RTSX-SU) ," The Aerospace Corporation, presented at the May 11, 2005 Briefing held at the NASA Goddard Space Flight Center.

 

NASA Independent Test of SX-A, SX-S, and SX-SU Home Page

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Last Revised: May 12, 2006
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