NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

RTAX250S Destructive Physical Analysis (DPA)

December, 2005

Summary

Two RTAX250S FPGAs were sent to Hi-Rel Laboratories for a destructive physical analysis (DPA).  The testing was performed in accordance with GSFC S-311-M-70, MIL-STD-1580B REQ. 16.1, MIL-STD-883 Method 5009, and applicable military standards.  The two devices meet the specified DPA requirements.

Device Information

Part Number:     RTAX250S
Package:         CQ208E
Grade:           E
Lot Date Code:   0507
Wafer Date Code: D1H381
S/N:             72529, 72589

Report and Images

DPA Report

The pictures below are of higher quality then the corresponding images in the .pdf file above.

The following files originally came in a .tif format and were converted to .jpg

115243-72529-view1.tif	115243-72589-view1.tif
115243-72529-view2.tif	115243-72589-view2.tif

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Last Revised: December 15, 2005
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