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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


Section 1.6 Electrical Characterization and Life Test

The ACTEL 1020 was put on life test at T = 125 °C and VCC = 5.0 V.  It successfully passed functional and parametric testing after 2000 hr.  Some AC tests such as TPLH and TPHL failed the 5-V test limit marginally on select pins.  These AC failures may possibly be attributed to test setup or fixture problems.  An example of electrical characterization tests performed for the life tests is given in Subsection 2.5.

The ACTEL 1280 was put on life test at T = 125 °C and VCC = 5.0 V.  It successfully passed functional and parametric testing after 500 hr.  The units were put back on test but further results were not available for publication of this report.   An example of electrical characterization tests for life test is given in Subsection 3.5.

The ACTEL 1020A was put on life test at T = 175 °C and VCC = 5.75 V.   It successfully passed functional and parametric testing after 2000 hr.  It was shown that one parametric test (IOL) exhibited a delta of between 12% and 18% of the original reading.  This occurred on the majority of units and most device pins tested for IOL.  All other parametrics tested demonstrated less than 5% change throughout the life test.  There was no failure analysis done on these parts to determine the apparent cause of the IOL drift.  Graphs for the IOL test characterization can be found in Subsection 4.2.


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Last Revised: January 09, 2002
Digital Engineering Institute
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