JPL Publication 92-22
September 15, 1992
Field Programmable Gate Arrays commonly called FPGA's are the newer generation of field programmable devices and offer more flexibility in the logic modules they incorporate and in how they are interconnected. The flexibility, the number of logic building blocks available, and the high gate densities achievable are why users find FPGA's attractive. These attributes are important in reducing product development costs and shortening the development cycle. The aerospace community is interested in incorporating this new generation of field programmable technology in space applications. To this end a consortium was formed to evaluate the quality, reliability, and radiation performance of FPGA's. This report presents the test results on FPGA parts provided by ACTEL Corporation.
1.1 Background
1.2 Introduction
1.3 Destructive Physical Analysis
1.4 Radiation Total Dose
1.5 Single Event Effects
1.6 Electrical Characterization and Life Test
1.7 Conclusions
1.8_Actel FPGA Reported Results (Table)
2.1 Radiation Data Total Dose
2.2 Radiation Data SEU
2.3 DPA Product Analysis/Step Coverage
2.4 Calculation of Current Density
2.5 Electrical Characterization Data
2.6 Life Test Results
2.7 Anomalous Behavior of Device Inputs
2.8 Radiation Data Dose Rate (See Subsection 3.1)
3.1 Radiation Data Dose Rate (ACT I&II)
3.2 Radiation Data SEU
3.3 DPA Product Analysis/Step Coverage
3.4 Calculation of Current Density
3.5 Electrical Characterization Data
3.6 Life Test Results (500 hour)
3.7 Radiation Data Total Dose
4.1 Radiation Data Total Dose
4.2 Current Density/Step Coverage
4.3 Life Test/Characterization
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