A scientific study of the problems
of digital engineering for space flight systems,
with a view to their practical solution.
Neutron Single Event Upsets In SRAM-Based FPGAs
Mattias Ohlsson
Peter Dyreklev
Karin Johansson
Ericsson Saab Avionics AB
Electromagnetic Technology Division
581 88 Linköping, Sweden
and
Peter Alfke
Xilinx, Inc.
2100 Logic Drive, San Jose
CA 95124, USA
Abstract
SRAM-based FPGAs have been studied for their sensitivity to atmospheric high energy neutrons. FPGAs with the supply voltage 5V and 3.3V were irradiated by 0-11, 14 and 100 MeV neutrons and showed a very low SEU susceptibility.
Table of Contents
I. Introduction
II. Experimental details
- Neutron facilities
- Device descriptions
- Experimental setup
- Test Procedure
III. Results and Calculations
- Experimental results
- SEU-rate calculation
IV. Discussion
V. Conclusion
List of Figures
Figure 1. Schematic of experimental setup
Conclusions
The FPGAs show a very low susceptibility to single event upsets caused by neutrons. No permanent effects were detected, reconfiguration of the device was sufficient to regain full functionality after the occurrence of a single event upset.
We conclude that these SRAM-based FPGAs can be used without limitation in the atmospheric radiation environment, contrary to SRAM memories were precaution in the use is necessary because of neutron induced SEU.
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Last Revised January 09, 2002
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