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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

ANTIFUSE FPGA FOR SPACE APPLICATIONS

Presented at the 1997 RADECS

Jih-Jong Wang, Brian E. Cronquist, Benny Sin and Jennifer J. Moriarta
Actel Corporation, Sunnyvale, CA94086, USA

Richard B. Katz
NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA

Abstract

This paper presents total dose and SEE testing data of recent antifuse products. It includes ONO-antifuse FPGAs: A1020B, A1020S, RH1020, A1280XL, A1460A, A14100A, A32140DX and A32200DX. Also included are preliminary results of pre-production metal to metal (M/M) antifuse FPGAs, the I100 and the RHI100. Finally, SEU rate calculations of Actel FPGAs are discussed.

Table of Contents

  1. Introduction
  2. Radiation testing
  3. Total Dose Characteristics
  4. Radiation Performance
    1. A1020B/A1020S/RH1020
    2. A1280XL
    3. A1460A/A14100A
    4. A32140DX/A32200DX
    5. I100/RHI100
  5. SEU Rate Calculations

 

List of Figures

Figure 1. Charge pump failure mechanism

Figure 2. A1020S Total Dose Testing Results

Figure 3. A1280XL proton testing results

Figure 4. A1460A total dose testing results

Figure 5. A32140A total dose (Cobalt-60) testing results

Figure 6. I100 total dose testing results

Figure 7. RHI100 total dose testing results

Figure 8. I100 proton testing results

Figure 9. I100 and RHI100 SEU testing results

List of Tables

Table 1. SEE Heavy Ions at BNL

Table 2. Space Radiation input parameters

Table 3. Calculated SEU rates

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Last Revised January 09, 2002
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