Workshop: EEPROM Reliability
On Wednesday October 12, 2005, a workshop on EEPROM reliability will be held at the NASA Goddard Space Flight Center in Greenbelt, MD. This full day workshop starts at 9:30 am in the Building 22, Room 396.
EEPROM devices are widely used in NASA and other military and aerospace digital electronics system. This meeting will consist of focused talks from design engineers, parts engineers, reliability and mission assurance engineers, and factory engineers with discussion. The intent is to share experiences and knowledge, promote awareness of issues with these devices, and disseminate preferred application practices, ranging from proper circuit design to error mitigation techniques to proper memory system architectures.
All attendees should complete the registration form below. Non-US citizens wishing to have access to NASA must complete their registration form no later than TBD, 2005. US citizens wishing to have access to NASA must complete the registration process no later than October 5, 2005. Webex access will be available, please select the appropriate registration type. Recording of this meeting will not be permitted.
If you wish to present at this workshop or submit a note, please send e-mail to email@example.com
Snacks for breaks will be provided, courtesy of the NASA Office of Logic Design. Each participant is responsible for their own lunch and dinner (federal rules).
- Richard Katz, NASA Office of Logic Design: Welcome, Introduction and Overview; The Ideal Device
- Michael Sampson, NASA GSFC Office of Systems Safety and Mission Assurance: Opening Remarks
- Rod Barto, NASA Office of Logic Design: Circuit Issues for Hitachi-die EEPROMs
- Jean BERTRAND – CNES, QA Engineer in Charge of VLSI: Failure of an HN58C1001 based EEPROM
- Erik Jerkersson, Saab Ericsson Space AB: The EEPROM Experience
- Amy J. Hurley, Naval Research Labs: SECCHI EEPROM Issues & Resolutions
- Greg Clifford, Silver Engineering, Inc.: One EEPROM Page Anomaly Study
- Ken Li, NASA Goddard Space Flight Center: ST-5 Experiences
- Yuan Chen: JPL: EEPROM Application Review and Recommendations
- Jose Florez, NASA Goddard Space Flight Center: NASA Advisory NA-GSFC-2005-04; Application of Hitachi 1-Mbit Die Based EEPROM Technology to Space Applications
- Mike Fitzpatrick and Dennis Adams, Northrop-Grumman: CMOS / SONOS EEPROM Reliability Overview
- Austin Semiconductor, Jeff Kendziorski: Reliability, Application Use, Unique Test Screening & Concepts/Ideas (long version)
- Maxwell Technologies
References and Related Works
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Last Revised: February 03, 2010
Digital Engineering Institute
Web Grunt: Richard Katz