July, 1998
Additional heavy ion tests were run on the National Semiconductor DS90C032 LVDS receiver. No latchups were observed during these test runs.
Run Name: BNL0797
Part #: DS90C032
Package: SOIC
Run # File Name Bias(V) LET Fluence Latch
74 LVDS1B1 5.5 74.7 5E7 No
75 LVDS2B1 5.5 74.7 1E8 No
76 LVDS3B1 5.5 74.7 1E8 No
100 LVDS2G2 5.5 82.6 2E7 No
101 LVDS3G1 5.5 82.6 2E7 No
The amount of runs was limited by available beam time. A future test will irradiate these parts at higher fluences and LET's.
Home - NASA Office of Logic Design
Last Revised:
April 10, 2004
Digital Engineering Institute
Web Grunt:
Richard Katz
