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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

Linear Technologies LTC1419 and LTC1419A

Heavy Ion Test SEL Test

BNL April, 1999

 

Robert Reed1, Paul Marshall2, Curtis Dunsmore3, Jim Fourney3 and Hak Kim3

  1. NASA/Goddard Space Flight Center, Greenbelt, MD 20771
  2. Consultant
  3. Jackson and Tull Chartered Engineers, Washington DC 20018

 

Test Date: April, 1999. Report Date: July, 1999

 

  1. Introduction and Devices Tested

    2. This study was undertaken to determine the latchup susceptibility of the Linear Technologies LTC1419 and LTC1419A COMLINEAR CLC502. The device was monitored for latchup induced high power supply currents by exposing it to a number of heavy ion beams at the Brookhaven National Laboratory Single Event Effects Test Facility.

  2. Test Facility

    3. Facility: Brookhaven National Laboratory Single Event Effects Test Facility

    Flux: 4.2 x 104 to 1.2 x 105 particles/cm2/s.

    Ions: Br (LET= 35 MeV-cm2 / mg) and I (LET= 60 MeV-cm2 / mg)

  3. Test Methods

    4. Temperature: room temp

    Test Hardware: programmable power supply.

    Definition of a destructive event (SEL): Supply current monitored for an increase or decease.

  4. Results

    5. No SELs were observed on 3 devices of each type were tested under bias conditions of 7 volts at all ion LETs to a fluence of 1x107 p/cm2. The table below gives the typical reuslts:

    ion

    roll

    Tilt

    LET

    Sigma

    Br

    0

    0

    34.7

    <1.00E-07

    Br

    0

    0

    34.7

    <1.00E-07

    Br

    0

    0

    34.7

    <1.00E-07

    Br

    0

    45

    49.07

    <1.35E-07

    Br

    0

    60

    69.4

    <1.98E-07

    Br

    -90

    60

    69.4

    <1.98E-07

    Br

    -90

    45

    49.07

    <1.40E-07

    I

    0

    0

    59.8

    <8.26E-08

    I

    0

    45

    84.57

    <1.40E-07

    I

    0

    60

    119.6

    <1.99E-07

    I

    -90

    60

    119.6

    <1.99E-07

    I

    -90

    45

    84.57

    <1.41E-07

    I

    0

    0

    59.8

    <1.00E-07

    I

    0

    0

    59.8

    <1.00E-07

     

  5. Recommendations

In general, devices are categorized based on heavy ion test data into one of the four following categories:

Category 1 – Recommended for usage in all NASA/GSFC spaceflight applications.

Category 2 – Recommended for usage in NASA/GSFC spaceflight applications, but may require mitigation techniques.

Category 3 – Recommended for usage in some NASA/GSFC spaceflight applications, but requires extensive mitigation techniques or hard failure recovery mode.

Category 4 – Not recommended for usage in any NASA/GSFC spaceflight applications.

The Linear Technologies LTC1419 and LTC1419A are Category 1 devices with respect to SEL.

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Last Revised: January 09, 2002
Digital Engineering Institute
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