NASA Office of Logic Design

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


Memories: Memory Vendors and Research Projects

 

WWW Site

Technology Description

Technical Contact

Intersil Home Page
ASI Home Page Austin Semiconductor
A variety of products, some including radiation shielding.   Check each product carefully (www page links supplied here for easy reference).
Welcome to Celis Semiconductor

Celis-semi. (rad-hard)

Radiation Hardened FeRAM and MCMs.  Technology uses Ferroelectric layered superlattice SBT (strontium bismuth tantalate) thin film capacitors with a claim for "virtually infinite endurance." Circuitry to protect data during power-up, power-down and brown-out conditions.  1T/1C and 2T/2C configurations. Celis Semiconductor
5475 Mark Dabling Blvd., Suite 102
Colorado Springs, CO 80918-3847

Tel: (719) 260-9133 or x5159
Fax: 719-593-8540

celis@celis-semi.com
DARPA/DSO - R&D Areas Materials and Processing Programs: Electromagnetic Materials Magnetic Materials and Devices

Magnetic multilayer films are interesting due to their unique transport behavior combined with the ability to be grown and patterned using traditional semiconductor fabrication techniques. The goal of the DARPA Magnetic Materials and Devices program is to develop magnetic memory and sensors. The
memory will be nonvolatile and radiation hard, have the potential density of dynamic random-access memory (DRAM) and the speed of static random-access memory (SRAM), also be low cost and low power. Sensors will be used for motion and rotation control as well as high-sensitivity magnetometers in antimine and perimeter defense. Basic materials work is being conducted to increase the Giant Magneto-Resistance (GMR) Delta-R/R ratio to 20 percent at 20 Gauss. Basic device work is being done to develop the spin transistor and spin tunneling devices. Issues include spin scattering at interfaces, as well as uniform growth and micromagnetic structure. For the spin tunneling device, controlled oxidation of the insulator is important. Existing materials processes are also being scaled up to increase memory densities.

Dr. Stuart A. Wolf

swolf@darpa.mil

Tel:: (703) 696-4440 or 202-767-4163
Fax: (703) 696-3999 or (703) 696-0218

Mailing Address:
Attn: Dr. Stuart A. Wolf
DARPA/DSO
3701 North Fairfax Drive
Arlington, VA 22203-1714

Northrop Grumman Radiation Hardened EEPROM m.fitzpatrick@ngc.com

Northrop Grumman Corporation
Electronic Sensors and Systems Sector
PO Box 1521 - MS3D14
Baltimore, MD 21203
Tel: (410) 765-7469
Fax:(410) 765-7652

Ramtron Ferroelectric random access memories (FRAM).  Serial and parallel configurations. Thomas Hoyt
Ramtron
1850 Ramtron Drive
Colorado Springs, CO 80921
Tel: 719-481-7000
FAX: 719-481-9294
Simtek Corporation (nvSRAM) nonvolatile Static Random Access Memory Tel: 800-637-1667
Fax: 719-531-9481

applications@simtek.com

Maxwell Technologies Packages die from IC manufacturers with integrated radiation shields.  See application note on radiation shielding above. Maxwell Technologies
9244 Balboa Avenue
San Diego, CA 92123
Tel: (858)503-3300
Fax:(858)503-3301
info@maxwell.com
UTMC Standard Products RadHard Memories

UT28F256 PROM - 32K x 8 RadHard PROM

UT28F64 PROM - 8K x 8 RadHard PROM
UTMC Microelectronic Systems Inc.
4350 Centennial Blvd.
Colorado Springs, CO 80907
800-645-UTMC

Home - NASA Office of Logic Design
Last Revised: October 15, 2005
Digital Engineering Institute
Web Grunt: Richard Katz
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