NASA Office of Logic Design

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


Raytheon Reliability Report
Memory Products
1991

Contents

Section 1

1.1 Introduction
1.2 Reliability: What is It?
1.3 Failure Rates and Units of Measurement
1.4 Bathtub Hazard Rate Curve
1.5 Accelerated Testing

Section 2 - Reliability Data

2.1 Sample Selection
2.2 Test Vehicles
2.3 Life Test Data
2.4 Qualification and Monitor Data

 

Appendix A

A.1 Failure Rates and MTTF
A.2 Relationship Between FR and MTTF
A.3 Calculation of Observed FR and MTTF
A.4 Observed and Predicted Failure Rates
A.5 Predicted MTTF

Appendix B - Extrapolating Failure Rates Using Arrhenius Equation

B.1 Calculation of Failure Rate and MTTF
B.2 Selection of Activation Energies

Appendix C - Definitions

 

Product Selection Guide

.zip file of this document


Home - NASA Office of Logic Design
Last Revised: July 13, 2003
Digital Engineering Institute
Web Grunt: Richard Katz
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