A set of 3 pre-production FM1608 FRAMs were subjected to heavy ion tests at Brookhaven National Lab, using titanium (228 MeV) at normal incidence, for an LET = 18.7 MeV-cm2/mg. The range of the particles was 47.7 µm.
Nominal voltages were used for this part, VCC = 5.0 VDC (input bias). The results and current strip charts are shown in the table below. Because of the low LET latchup, latchup threshold was not measured and only little SEU data was observed.
Summary Data from FM1608/Fujitsu Heavy Ion Test at BNL, April, 1999
| Run No. | Device ID | Flux (#/cm2/sec) | Fluence (#/cm2) | Latch ? | Notes | Current Strip Chart |
| 43 | FRFU1 | 91380 | 1.8010e+6 | Part In Reset | ||
| 44 | FRFU1 | 90420 | 729.70e+3 | Latch | Immediate | frfu1t2.pdf |
| 45 | FRFU1 | 93530 | 313.30e+3 | Latch | Immediate | |
| 46 | FRFU1 | 88660 | 1.8460e+6 | Latch | Quick | frfu1t4.pdf |
| 47 | FRFU1 | 91860 | 600.70e+3 | Latch | Quick | frfu1t5.pdf |
| 48 | FRFU1 | 90730 | 1.2310e+6 | Latch | Quick, Part In Reset | |
| 49 | FRFU2 | 91480 | 2.6270e+6 | Latch | Tripped Supply Icc > 800 mA |
frfu2t1.pdf |
| 50 | FRFU2 | 90860 | 1.4330e+6 | Latch | frfu2t2.pdf | |
| 51 | FRFU2 | 90800 | 1.0020e+6 | Latch | ||
| 52 | FRFU2 | 91520 | 1.4630e+6 | Latch | frfu2t4.pdf | |
| 53 | FRFU2 | 90510 | 711.40e+3 | Latch | frfu2t5.pdf | |
| 54 | FRFU3 | 95010 | 996.70e+3 | Latch | frfu3t1.pdf | |
| 55 | FRFU3 | 94720 | 795.70e+3 | Latch | frfu3t2.pdf | |
| 56 | FRFU3 | 98340 | 340.30e+3 | Latch | frfu3t3.pdf | |
| 57 | FRFU3 | 95650 | 750.90e+3 | Latch | frfu3t4.pdf | |
| 58 | FRFU3 | 95410 | 1.3580e+6 | Latch | frfu3t5.pdf |
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Last Revised: January 09, 2002
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