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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

1998 Military and Aerospace Applications of

Programmable Devices and Technologies Conference

(MAPLD Conference)

PCD7: P. Layton, D. Strobel, H. Anthony, R. Boss, P. Hsu
Space Electronics Inc.

"TID and SEE data on Rad Tolerant FPGA’s"

Radiation test data is presented for families of radiation tolerant FPGA’s. Actel-based antifuse technology Total Ionizing Dose (TID) data is presented for several die lots. Single Event Effects (SEE) data on reprogrammable 50,000 gate Gatefield based devices is also presented. Since the Gatefield device is Susceptible to Single Event Latchup (SEL), data on evaluation of a latchup protection for this device will also be presented.

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