(MAPLD Conference)
PCD4: Scott
Kniffin and Kusum Sahu
Unisys Federal Systems
"A Compendium of Total Dose Data on EEPROMs for NASA Programs"
This paper presents a summary of the variability in the TID radiation tolerance of SEEQ 32kX8 EEPROMs with lot date codes (LDC) varying from 9052 to 9530. These EEPROMs were evaluated for various NASA programs using low dose rate exposures varying from 0.01 to 0.08Rads(Si)/sec, from a 60Co source. The radiation tolerance of these parts varied from 3-40kRads(Si) depending upon the LDC. It was also found that the WRITE mode capability was generally lost at lower TID level than the READ mode capability. With increasing radiation exposures, some increase was also observed in power dissipation. The paper also presents the results of TID evaluations of 1Mbit EEPROMs from Hitachi and AMD.
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Last Revised: July 03, 2002
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